Central Library

Your search returned 2 results. Subscribe to this search

Unhighlight Highlight
|
Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty.

by Goel, Sandeep K [editor of compilation.] | Chakrabarty, Krishnendu [editor of compilation.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, 2014Online access: Click here to view. Availability: No items available

Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.

by Chrzanowska-Jeske, Malgorzata [editor.] | Weide-Zaage, Kirsten [editor.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Online access: Click here to view. Availability: No items available