000 00346nam a2200121Ia 4500
008 190711s9999 xx 000 0 und d
082 _a621.3819642 I59
100 _aINSTITUTEE OF ELECTRICAL AND ELECTRONICS ENGINEERS
245 0 _aIEEE STANDARD ATLAS TEST LANGUAGE
260 _aNEW YORK
_bIEEE Press
_c1984
300 _a26X19
942 _cBK
_2DDC
999 _c20050
_d20050