000 00326nam a2200121Ia 4500
008 190711s9999 xx 000 0 und d
082 _a620.11299028 W653
100 _aWIFFEN.F.W
245 0 _aADVANCED TECHNIQUES FOR CHARACTERIZING MICROSTRUCTURES
260 _aNEW YORK
_bA.I.M.E
_c1982
300 _a24X16
942 _cBK
_2DDC
999 _c20268
_d20268