000 00325nam a2200133Ia 4500
008 190711s9999 xx 000 0 und d
020 _a0070653410
082 _a621.38175 T877
100 _aTSUI,F.F
245 0 _aLSI/VLSI TESTABILITY DESIGN
260 _aNEW YORK
_bMcGraw-Hill
_c1987
300 _a22X15
942 _cBK
_2DDC
999 _c23409
_d23409