000 00384nam a2200145Ia 4500
008 190711s9999 xx 000 0 und d
020 _a0824785061
082 _a519.5 B162
100 _aBAIN
245 0 _aSTATISTICAL ANALYSIS OF RELIABILITY AND LIFE-TESTING MODELS:
250 _a2
260 _aNEW YORK
_bMarcel Dekker
_c1991
300 _avii+496p.,23X16Cms.
942 _cBK
_2DDC
999 _c27509
_d27509