000 | 03270nam a22004815i 4500 | ||
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001 | 978-3-319-11824-6 | ||
003 | DE-He213 | ||
005 | 20200420221248.0 | ||
007 | cr nn 008mamaa | ||
008 | 150212s2015 gw | s |||| 0|eng d | ||
020 |
_a9783319118246 _9978-3-319-11824-6 |
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024 | 7 |
_a10.1007/978-3-319-11824-6 _2doi |
|
050 | 4 | _aTK7888.4 | |
072 | 7 |
_aTJFC _2bicssc |
|
072 | 7 |
_aTEC008010 _2bisacsh |
|
082 | 0 | 4 |
_a621.3815 _223 |
100 | 1 |
_aTehranipoor, Mark (Mohammad). _eauthor. |
|
245 | 1 | 0 |
_aCounterfeit Integrated Circuits _h[electronic resource] : _bDetection and Avoidance / _cby Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte. |
264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2015. |
|
300 |
_aXX, 269 p. 134 illus., 109 illus. in color. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
||
338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
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505 | 0 | _aIntroduction -- Conterfeit Integrated Circuits -- Counterfeit Defects -- Physical Tests for Counterfeit Detection -- Electrical Tests for Counterfeit Detection -- Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods -- Advanced Detection: Physical Tests -- Advanced Detection: Electrical Tests -- Combating Die and IC Recycling -- Hardware IP Watermarking -- Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly -- Chip ID. | |
520 | _aThis timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade.  The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs).  Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat.   �      Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; �      Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; �      Provides step-by-step solutions for detecting different types of counterfeit ICs; �      Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government. | ||
650 | 0 | _aEngineering. | |
650 | 0 | _aMicroprocessors. | |
650 | 0 | _aElectronic circuits. | |
650 | 1 | 4 | _aEngineering. |
650 | 2 | 4 | _aCircuits and Systems. |
650 | 2 | 4 | _aProcessor Architectures. |
650 | 2 | 4 | _aElectronic Circuits and Devices. |
700 | 1 |
_aGuin, Ujjwal. _eauthor. |
|
700 | 1 |
_aForte, Domenic. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783319118239 |
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-319-11824-6 |
912 | _aZDB-2-ENG | ||
942 | _cEBK | ||
999 |
_c52411 _d52411 |