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001			978-1-4614-4587-6
003			DE-He213
005			20200420221249.0
007			cr nn 008mamaa
008			121120s2013 xxu| s |||| 0|eng d
020			_a9781461445876 _9978-1-4614-4587-6
024	7		_a10.1007/978-1-4614-4587-6 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
245	1	0	_aNyquist AD Converters, Sensor Interfaces, and Robustness _h[electronic resource] : _bAdvances in Analog Circuit Design, 2012 / _cedited by Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2013.
300			_aX, 294 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aPart I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
520			_aThis book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.  Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
650		0	_aEngineering.
650		0	_aElectronics.
650		0	_aMicroelectronics.
650		0	_aElectronic circuits.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
700	1		_avan Roermund, Arthur H.M. _eeditor.
700	1		_aBaschirotto, Andrea. _eeditor.
700	1		_aSteyaert, Michiel. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461445869
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-4587-6
912			_aZDB-2-ENG
942			_cEBK
999			_c52491 _d52491