000			02868nam a22005175i 4500
001			978-1-4614-4078-9
003			DE-He213
005			20200421112037.0
007			cr nn 008mamaa
008			141108s2015 xxu| s |||| 0|eng d
020			_a9781461440789 _9978-1-4614-4078-9
024	7		_a10.1007/978-1-4614-4078-9 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
245	1	0	_aCircuit Design for Reliability _h[electronic resource] / _cedited by Ricardo Reis, Yu Cao, Gilson Wirth.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2015.
300			_aVI, 272 p. 190 illus., 132 illus. in color. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aIntroduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
520			_aThis book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations.
650		0	_aEngineering.
650		0	_aComputer-aided engineering.
650		0	_aQuality control.
650		0	_aReliability.
650		0	_aIndustrial safety.
650		0	_aElectronic circuits.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aQuality Control, Reliability, Safety and Risk.
650	2	4	_aComputer-Aided Engineering (CAD, CAE) and Design.
700	1		_aReis, Ricardo. _eeditor.
700	1		_aCao, Yu. _eeditor.
700	1		_aWirth, Gilson. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461440772
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-4078-9
912			_aZDB-2-ENG
942			_cEBK
999			_c56393 _d56393