000 | 03591nam a22005055i 4500 | ||
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001 | 978-3-319-00533-1 | ||
003 | DE-He213 | ||
005 | 20200421112227.0 | ||
007 | cr nn 008mamaa | ||
008 | 130611s2014 gw | s |||| 0|eng d | ||
020 |
_a9783319005331 _9978-3-319-00533-1 |
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024 | 7 |
_a10.1007/978-3-319-00533-1 _2doi |
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050 | 4 | _aTK7888.4 | |
072 | 7 |
_aTJFC _2bicssc |
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072 | 7 |
_aTEC008010 _2bisacsh |
|
082 | 0 | 4 |
_a621.3815 _223 |
100 | 1 |
_aLiu, Xiao. _eauthor. |
|
245 | 1 | 0 |
_aTrace-Based Post-Silicon Validation for VLSI Circuits _h[electronic resource] / _cby Xiao Liu, Qiang Xu. |
264 | 1 |
_aHeidelberg : _bSpringer International Publishing : _bImprint: Springer, _c2014. |
|
300 |
_aXV, 108 p. 59 illus., 38 illus. in color. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
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490 | 1 |
_aLecture Notes in Electrical Engineering, _x1876-1100 ; _v252 |
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505 | 0 | _aIntroduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion. | |
520 | _aThis book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. �         Provides a comprehensive summary of state-of-the-art on post-silicon validation; �         Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; �         Illustrate key concepts and algorithms with real examples.        . | ||
650 | 0 | _aEngineering. | |
650 | 0 | _aMicroprocessors. | |
650 | 0 | _aSemiconductors. | |
650 | 0 | _aElectronic circuits. | |
650 | 1 | 4 | _aEngineering. |
650 | 2 | 4 | _aCircuits and Systems. |
650 | 2 | 4 | _aProcessor Architectures. |
650 | 2 | 4 | _aSemiconductors. |
700 | 1 |
_aXu, Qiang. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783319005324 |
830 | 0 |
_aLecture Notes in Electrical Engineering, _x1876-1100 ; _v252 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-319-00533-1 |
912 | _aZDB-2-ENG | ||
942 | _cEBK | ||
999 |
_c57730 _d57730 |