000 03269nam a22005295i 4500
001 978-3-319-10819-3
003 DE-He213
005 20200421112542.0
007 cr nn 008mamaa
008 150310s2015 gw | s |||| 0|eng d
020 _a9783319108193
_9978-3-319-10819-3
024 7 _a10.1007/978-3-319-10819-3
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aCui, Qiang.
_eauthor.
245 1 0 _aOn-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
_h[electronic resource] /
_cby Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2015.
300 _aXVII, 86 p. 59 illus., 42 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aBasics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
520 _aThis book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.
650 0 _aEngineering.
650 0 _aElectronic circuits.
650 0 _aElectronics.
650 0 _aMicroelectronics.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aElectronic Circuits and Devices.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
700 1 _aLiou, Juin J.
_eauthor.
700 1 _aHajjar, Jean-Jacques.
_eauthor.
700 1 _aSalcedo, Javier.
_eauthor.
700 1 _aZhou, Yuanzhong.
_eauthor.
700 1 _aSrivatsan, Parthasarathy.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783319108186
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-319-10819-3
912 _aZDB-2-ENG
942 _cEBK
999 _c58319
_d58319