000 | 03261nam a22005175i 4500 | ||
---|---|---|---|
001 | 978-3-319-00593-5 | ||
003 | DE-He213 | ||
005 | 20200421112543.0 | ||
007 | cr nn 008mamaa | ||
008 | 130723s2014 gw | s |||| 0|eng d | ||
020 |
_a9783319005935 _9978-3-319-00593-5 |
||
024 | 7 |
_a10.1007/978-3-319-00593-5 _2doi |
|
050 | 4 | _aTK7888.4 | |
072 | 7 |
_aTJFC _2bicssc |
|
072 | 7 |
_aTEC008010 _2bisacsh |
|
082 | 0 | 4 |
_a621.3815 _223 |
100 | 1 |
_avan der Horst, Marcel J. _eauthor. |
|
245 | 1 | 0 |
_aEMI-Resilient Amplifier Circuits _h[electronic resource] / _cby Marcel J. van der Horst, Wouter A. Serdijn, Andr�e C. Linnenbank. |
264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2014. |
|
300 |
_aXV, 307 p. _bonline resource. |
||
336 |
_atext _btxt _2rdacontent |
||
337 |
_acomputer _bc _2rdamedia |
||
338 |
_aonline resource _bcr _2rdacarrier |
||
347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aAnalog Circuits and Signal Processing, _x1872-082X ; _v118 |
|
505 | 0 | _aIntroduction -- Decreasing the disturbance coupled to amplifiers -- Modelling of active devices -- The Cascode and Differential amplifier stages -- Design of EMI-resilient single-stage amplifiers -- Design of EMI-resilient dual-stage amplifiers -- Realizations -- Conclusions and recommendations. | |
520 | _aThis book enables circuit designers to reduce the errors introduced by the fundamental limitations and electromagnetic interference (EMI) in negative-feedback amplifiers.  The authors describe a systematic design approach for application specific negative-feedback amplifiers, with specified signal-to-error ratio (SER).  This approach enables designers to calculate noise, bandwidth, EMI, and the required bias parameters of the transistors used in  application specific amplifiers in order to meet the SER requirements.   �         Describes design methods that incorporate electromagnetic interference (EMI) in the design of application specific negative-feedback amplifiers; �         Provides designers with a structured methodology to avoid the use of trial and error in meeting signal-to-error ratio (SER) requirements; �         Equips designers to increase EMI immunity of the amplifier itself, thus avoiding filtering at the input, reducing the number of components and avoiding detrimental effects on noise and stability.  . | ||
650 | 0 | _aEngineering. | |
650 | 0 | _aElectronic circuits. | |
650 | 0 | _aElectronics. | |
650 | 0 | _aMicroelectronics. | |
650 | 1 | 4 | _aEngineering. |
650 | 2 | 4 | _aCircuits and Systems. |
650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
650 | 2 | 4 | _aElectronic Circuits and Devices. |
700 | 1 |
_aSerdijn, Wouter A. _eauthor. |
|
700 | 1 |
_aLinnenbank, Andr�e C. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783319005928 |
830 | 0 |
_aAnalog Circuits and Signal Processing, _x1872-082X ; _v118 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-319-00593-5 |
912 | _aZDB-2-ENG | ||
942 | _cEBK | ||
999 |
_c58378 _d58378 |