000 03315nam a2200889 i 4500
001 5361029
003 IEEE
005 20200421114117.0
006 m o d
007 cr |n|||||||||
008 110519t20152009njua ob 001 0 eng d
010 _z �2011377262 (print)
015 _z015-17502 (print)
015 _zGBA944641 (print)
016 _z015175021 (print)
020 _z0471731722
_qpaper
020 _z0470455268
_qelectronic
020 _a9780470455265
_qelectronic
020 _z9780471731726
_qpaper
024 7 _a10.1002/9780470455265
_2doi
035 _a(CaBNVSL)mat05361029
035 _a(IDAMS)0b00006481178849
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7871.99.M44
_bR455 2009eb
084 _aELT 358f
_2stub
084 _aZN 4960
_2rvk
245 0 0 _aReliability wearout mechanisms in advanced CMOS technologies /
_cAlvin W. Strong ... [et al.].
264 1 _aPiscataway, New Jersey :
_bIEEE Press,
_cc2009.
300 _a1 PDF (xv, 624 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
490 1 _aIEEE Press series on microelectronic systems ;
_v12
504 _aIncludes bibliographical references and index.
505 0 _aIntroduction / Alvin W. Strong -- Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Su�n�e -- Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Su�n�e -- Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa -- Hot carriers / Stewart E. Rauch, III -- Stress-induced voiding / Timothy D. Sullivan -- Electromigration / Timothy D. Sullivan.
506 1 _aRestricted to subscribers or individual electronic text purchasers.
538 _aMode of access: World Wide Web.
588 _aDescription based on PDF viewed 12/18/2015.
650 0 _aMetal oxide semiconductors, Complementary
_xReliability.
655 0 _aElectronic books.
695 _aWires
695 _aStress
695 _aSubstrates
695 _aTransistors
695 _aSilicon
695 _aStrain
695 _aNitrogen
695 _aReliability
695 _aReliability engineering
695 _aMOSFET circuits
695 _aMaterials
695 _aMetallization
695 _aInterface states
695 _aJunctions
695 _aLogic gates
695 _aForce
695 _aHot carriers
695 _aIndexes
695 _aElectric breakdown
695 _aElectromigration
695 _aElectron traps
695 _aDegradation
695 _aDielectrics
695 _aCMOS integrated circuits
695 _aCMOS technology
695 _aCharge carrier processes
695 _aAtomic measurements
695 _aBooks
695 _aAcceleration
700 1 _aStrong, Alvin Wayne,
_d1946-
710 2 _aWiley,
_epublisher.
710 2 _aIEEE Xplore (Online Service),
_edistributor.
776 0 8 _iPrint version:
_w 2011377262
_z9780471731726
830 0 _aIEEE Press Series on Microelectronic Systems ;
_v12
856 4 2 _3Abstract with links to resource
_uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
942 _cEBK
999 _c59604
_d59604