| 000 | 04916cam a2200553Ki 4500 | ||
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| 001 | ocn974641922 | ||
| 003 | OCoLC | ||
| 005 | 20220711203354.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 170306s2017 enk ob 001 0 eng d | ||
| 040 |
_aN$T _beng _erda _epn _cN$T _dEBLCP _dDG1 |
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| 020 |
_a9781119208549 _q(electronic bk.) |
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| 020 |
_a1119208548 _q(electronic bk.) |
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| 020 | _z9781119208525 | ||
| 020 | _z1119208521 | ||
| 020 | _z9781119208556 (epub) | ||
| 035 | _a(OCoLC)974641922 | ||
| 050 | 4 |
_aTK7876 _b.M2545 2017eb |
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| 072 | 7 |
_aTEC _x009070 _2bisacsh |
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| 082 | 0 | 4 |
_a621.381/30284 _223 |
| 049 | _aMAIN | ||
| 245 | 0 | 0 |
_aMicrowave dielectric materials and applications / _cedited by Dr. Mailadil T. Sebastian, Dr. Heli Jantunen, Dr. Rick Ubic. |
| 264 | 1 |
_aChichester, UK ; _aHoboken, NJ : _bJohn Wiley & Sons, _c2017. |
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| 300 | _a1 online resource. | ||
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 504 | _aIncludes bibliographical references and index. | ||
| 588 | 0 | _aPrint version record. | |
| 505 | 0 | _aMicrowave Materials and Applications; Contents; List of Contributors; Series Preface; Wiley Series in Materials for Electronic and Optoelectronic Applications; Preface; 1 Measurement of Microwave Dielectric Properties and Factors Affecting Them; 1.1 Introduction; 1.2 Permittivity ( r) and quality factor (Q); 1.3 Measurement of Microwave Dielectric Properties; 1.4 Methods of Measurement; 1.4.1 Hakki and Coleman (Courtney) Method; 1.4.2 TE01d Mode Dielectric Resonator Method; 1.4.3 Measurement of the Quality Factor by a Strip Line Excited Using the Cavity Method | |
| 505 | 8 | _a1.4.4 Whispering Gallery Mode (WGM) Resonators1.4.5 Split Post Dielectric Resonator (SPDR); 1.4.6 Cavity Perturbation Method; 1.4.7 TM0n0 Mode and Re-entrant Cavity Methods; 1.4.8 TE01n Mode Cavities; 1.4.9 Thin Samples and Free-Space Methods; 1.5 Measurement of EMI Shielding Effectiveness; 1.5.1 Waveguide Method; 1.6 Terahertz and Millimeter Wave Measurements; 1.6.1 Backward Wave Oscillator (BWO); 1.6.2 Terahertz Time-Domain Spectroscopy (THz-TDS); 1.7 Measurement of Dielectric Properties of Powder Samples; 1.8 Estimation of Dielectric Loss by Spectroscopic Methods | |
| 505 | 8 | _a1.9 Factors Affecting Dielectric Loss1.10 Measurement of Temperature Coefficient of Resonant Frequency; 1.11 Tuning of the Resonant Frequency; References; 2 Modeling of Microwave Dielectric Properties of Composites; 2.1 Introduction; 2.2 Connectivity; 2.3 Electrostatic Theory; 2.3.1 Polarizability; 2.3.2 Scattering; 2.3.3 Orientation; 2.4 Mixing Equations; 2.4.1 Clausius-Mossotti; 2.4.2 Maxwell-Garnett; 2.4.3 Bruggeman Symmetric; 2.4.4 Bruggeman Non-symmetric; 2.4.5 Sen Scala-Cohen; 2.4.6 Coherent Potential; 2.4.7 Looyenga; 2.4.8 Lichtenecker; 2.4.9 Modified Lichtenecker; 2.4.10 Differential | |
| 505 | 8 | _a2.4.11 General Mixing Model2.4.12 Effective Medium Theory (EMT); 2.4.13 Jayasundere-Smith; 2.4.14 Vo-Shi; 2.4.15 Interphase Power Law (IPL); 2.5 Effect of Porosity; 2.5.1 Permittivity; 2.5.2 Dielectric Losses; 2.5.3 Dielectric Properties of Powders; 2.6 Conclusion; References; 3 Perovskites; 3.1 Introduction; 3.2 Lattice Constant Prediction; 3.3 Tolerance Factor; 3.4 Octahedral Tilting; 3.5 Simple Perovskites; 3.5.1 LnAlO3 Type Materials; 3.5.2 Ag(Nb1-xTax)O3 Type Materials; 3.5.3 Ca-Based Perovskites; 3.6 Cation Ordering; 3.6.1 1:1 Ordered Perovskites; 3.6.2 1:2 Ordering; 3.6.3 1:3 Ordering | |
| 505 | 8 | _a3.6.4 1:2:1 Ordering3.7 Cation Deficient Perovskites; 3.8 Summary; References; 4 High Permittivity Materials; 4.1 Introduction; 4.2 The BaO-Ln2O3-TiO2 System; 4.2.1 Crystal Structure of Ba6-3xLn8+2xTi18O54; 4.2.2 Tolerance Factor and Its Effect on the Temperature Coefficient; 4.2.3 Microwave Dielectric Properties of BaO-Ln2O3-TiO2 System; 4.3 The Effect of Processing Parameters on Electrical Properties; 4.4 Titania; 4.5 Sr1-3x/2CexTiO3 Ceramics; 4.5.1 Crystal Structure of Sr1-3x/2CexTiO3 System; 4.5.2 Microstructure and Dielectric Properties of SCT ceramics; 4.5.3 (Sr0.75-xPbxCe0.167)TiO3 | |
| 650 | 0 |
_aMicrowave devices _xMaterials. _96999 |
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| 650 | 0 |
_aDielectrics. _97000 |
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| 650 | 7 |
_aDielectrics. _2fast _0(OCoLC)fst00893122 _97000 |
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| 650 | 7 |
_aMicrowave devices _xMaterials. _2fast _0(OCoLC)fst01020199 _96999 |
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| 650 | 7 |
_aTECHNOLOGY & ENGINEERING / Mechanical _2bisacsh _97001 |
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| 655 | 4 |
_aElectronic books. _93294 |
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| 700 | 1 |
_aSebastian, M. T., _d1952- _eeditor. _97002 |
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| 700 | 1 |
_aJantunen, Heli, _eeditor. _97003 |
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| 700 | 1 |
_aUbic, Rick, _eeditor. _97004 |
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| 776 | 0 | 8 |
_iPrint version: _tMicrowave dielectric materials and applications. _dChichester, UK ; Hoboken, NJ : John Wiley & Sons, 2017 _z9781119208525 _w(DLC) 2016052142 _w(OCoLC)965331561 |
| 856 | 4 | 0 |
_uhttps://doi.org/10.1002/9781119208549 _zWiley Online Library |
| 942 | _cEBK | ||
| 994 |
_a92 _bDG1 |
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_c68786 _d68786 |
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