| 000 | 03040cam a22006618i 4500 | ||
|---|---|---|---|
| 001 | on1104910635 | ||
| 003 | OCoLC | ||
| 005 | 20220711203522.0 | ||
| 006 | m d | | | ||
| 007 | cr ||||||||||| | ||
| 008 | 190607s2019 nju ob 001 0 eng | ||
| 010 | _a 2019023207 | ||
| 040 |
_aDLC _beng _erda _cDLC _dOCLCO _dOCLCF _dEBLCP _dDG1 _dUKMGB |
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| 015 |
_aGBB9E7484 _2bnb |
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| 016 | 7 |
_a019521176 _2Uk |
|
| 019 | _a1117279177 | ||
| 020 |
_a9781119417644 _q(epub) |
||
| 020 | _a1119417643 | ||
| 020 |
_a9781119417620 _q(adobe pdf) |
||
| 020 | _a1119417627 | ||
| 020 |
_z9781119417583 _q(cloth) |
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| 020 |
_a9781119417651 _q(electronic bk.) |
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| 020 |
_a1119417651 _q(electronic bk.) |
||
| 020 | _z1119417589 | ||
| 029 | 1 |
_aUKMGB _b019521176 |
|
| 035 |
_a(OCoLC)1104910635 _z(OCoLC)1117279177 |
||
| 037 |
_a9781119417644 _bWiley |
||
| 042 | _apcc | ||
| 050 | 0 | 0 | _aTP156.S95 |
| 082 | 0 | 0 |
_a620/.44 _223 |
| 049 | _aMAIN | ||
| 100 | 1 |
_aWatts, John F., _eauthor. _98427 |
|
| 245 | 1 | 3 |
_aAn introduction to surface analysis by XPS and AES / _cJohn F Watts, The Surface Analysis Laboratory, Department of Mechanical Engineering Sciences, University of Surrey, John Wolstenholme. |
| 250 | _aSecond edition. | ||
| 263 | _a1910 | ||
| 264 | 1 |
_aHoboken : _bWiley, _c2019. |
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| 300 | _a1 online resource | ||
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bn _2rdamedia |
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| 338 |
_aonline resource _bnc _2rdacarrier |
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| 504 | _aIncludes bibliographical references and index. | ||
| 520 |
_a"The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"-- _cProvided by publisher. |
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| 588 | _aDescription based on print version record and CIP data provided by publisher; resource not viewed. | ||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. _96442 |
|
| 650 | 0 |
_aElectron spectroscopy. _98428 |
|
| 650 | 0 |
_aPhotoelectron spectroscopy. _98429 |
|
| 650 | 0 |
_aAuger effect. _98430 |
|
| 650 | 7 |
_aAuger effect. _2fast _0(OCoLC)fst00821304 _98430 |
|
| 650 | 7 |
_aElectron spectroscopy. _2fast _0(OCoLC)fst00906707 _98428 |
|
| 650 | 7 |
_aPhotoelectron spectroscopy. _2fast _0(OCoLC)fst01061561 _98429 |
|
| 650 | 7 |
_aSurfaces (Technology) _xAnalysis. _2fast _0(OCoLC)fst01139279 _96442 |
|
| 655 | 0 |
_aElectronic books. _93294 |
|
| 700 | 1 |
_aWolstenholme, John, _eauthor. _98431 |
|
| 776 | 0 | 8 |
_iPrint version: _aWatts, John F.. _tAn introduction to surface analysis by XPS and AES _bSecond edition. _dHoboken : Wiley, 2019. _z9781119417583 _w(DLC) 2019023206 |
| 856 | 4 | 0 |
_uhttps://doi.org/10.1002/9781119417651 _zWiley Online Library |
| 942 | _cEBK | ||
| 994 |
_a92 _bDG1 |
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| 999 |
_c69095 _d69095 |
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