000 02274cam a2200589 i 4500
001 ocn989811256
003 OCoLC
005 20220711203535.0
006 m o d
007 cr |||||||||||
008 170608s2018 nju ob 001 0 eng
010 _a 2017027875
040 _aDLC
_beng
_erda
_epn
_cDLC
_dOCLCF
_dN$T
_dDG1
_dQCL
_dYDX
_dSTF
_dDLC
_dOCLCQ
020 _a9781118676172
_q(pdf)
020 _a1118676173
020 _a9781118676189
_q(epub)
020 _a1118676181
020 _a9781118676165
020 _a1118676165
020 _z9781119990918
_q(hardback)
020 _z1119990912
020 _z9781119990901
020 _z1119990904
029 1 _aAU@
_b000060209671
029 1 _aCHVBK
_b571898505
029 1 _aCHNEW
_b001060483
035 _a(OCoLC)989811256
042 _apcc
050 0 0 _aQD96.X2
072 7 _aSCI
_x013010
_2bisacsh
082 0 0 _a543/.62
_223
049 _aMAIN
100 1 _aEvans, John,
_d1949 June 2-
_eauthor.
_98614
245 1 0 _aX-ray absorption spectroscopy for the chemical and materials sciences /
_cProfessor, John Evans, Chemistry, University of Southampton, UK, Diamond Light Source, UK.
250 _aFirst edition.
264 1 _aHoboken, NJ :
_bWiley,
_c[2018]
300 _a1 online resource
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bn
_2rdamedia
338 _aonline resource
_bnc
_2rdacarrier
504 _aIncludes bibliographical references and index.
588 0 _aPrint version record and CIP data provided by publisher.
505 0 _aIntroduction to X-Ray Absorption Fine Structure (XAFS) -- Basis of XAFS -- X-Ray Sources and Beamlines -- Experimental Methods -- Data Analysis and Simulation Methods -- Case Studies.
650 0 _aX-ray spectroscopy.
_98615
650 7 _aSCIENCE
_xChemistry
_xAnalytic.
_2bisacsh
_98616
650 7 _aX-ray spectroscopy.
_2fast
_0(OCoLC)fst01181847
_98615
655 4 _aElectronic books.
_93294
776 0 8 _iPrint version:
_aEvans, John, 1949 June 2-
_tX-ray absorption spectroscopy for the chemical and materials sciences.
_bFirst edition.
_dHoboken, NJ : Wiley, [2018]
_z9781119990918
_w(DLC) 2017024956
856 4 0 _uhttps://doi.org/10.1002/9781118676165
_zWiley Online Library
942 _cEBK
994 _aC0
_bDG1
999 _c69153
_d69153