000			02114cam a2200481Ia 4500
001			on1230218615
003			OCoLC
005			20220711203636.0
006			m o d
007			cr |n|||||||||
008			210111s2021 enk ob 001 0 eng d
040			_aYDX _beng _cYDX _dDG1 _dOCLCO _dDG1 _dUKAHL _dOCLCF
020			_a9781119808244 _q(electronic bk. : oBook)
020			_a1119808243 _q(electronic bk. : oBook)
020			_a9781119808220 _q(electronic bk.)
020			_a1119808227 _q(electronic bk.)
020			_z1786306409
020			_z9781786306401
035			_a(OCoLC)1230218615
050		4	_aQC88
082	0	4	_a389/.1 _223
049			_aMAIN
100	1		_aDahoo, Pierre Richard. _99558
245	1	0	_aApplications and metrology at nanometer scale. _n1, _pSmart materials, electromagnetic waves and uncertainties _h[electronic resource] / _cPierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.
260			_aLondon : _bISTE Ltd. ; _aHoboken : _bWiley _c2021.
300			_a1 online resource
490	1		_aMechanical engineering and solid mechanics series
490	1		_aReliability of multiphysical systems set ; _vv. 9
505	0		_aNanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics.
504			_aIncludes bibliographical references and index.
590			_bWiley Frontlist Obook All English 2021
650		0	_aMetrology. _96667
650		7	_aMetrology. _2fast _0(OCoLC)fst01018841 _96667
655		4	_aElectronic books. _93294
700	1		_aPougnet, Philippe. _99559
700	1		_aEl Hami, Abdelkhalak. _96639
776	0	8	_iPrint version: _z1786306409 _z9781786306401 _w(OCoLC)1225191343
830		0	_aMechanical engineering and solid mechanics series. _97010
830		0	_aReliability of multiphysical systems set ; _vv. 9. _99560
856	4	0	_uhttps://doi.org/10.1002/9781119808244 _zWiley Online Library
942			_cEBK
994			_a92 _bDG1
999			_c69435 _d69435