000			02053nam a2200469Ii 4500
001			on1250021988
003			OCoLC
005			20220711203659.0
006			m o d
007			cr cnu|||unuuu
008			210507s2021 enk o 000 0 eng d
040			_aDG1 _beng _erda _epn _cDG1 _dOCLCO
020			_a9781119818984 _q(electronic bk. : oBook)
020			_a1119818982 _q(electronic bk. : oBook)
020			_z9781786306876
024	7		_a10.1002/9781119818984 _2doi
029	1		_aAU@ _b000069150874
035			_a(OCoLC)1250021988
050		4	_aQC88
082	0	4	_a389/.1 _223
049			_aMAIN
100	1		_aDahoo, Pierre Richard, _eauthor. _99558
245	1	0	_aApplications and metrology at nanometer scale. _n2, _pMeasurement systems, quantum engineering and RBDO method / _cPierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
246	3	0	_aMeasurement systems, quantum engineering and RBDO method
264		1	_aLondon, UK : _bISTE, Ltd. : _aHoboken, NJ : _bWiley, _c2021.
300			_a1 online resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
490	1		_aReliability of Multiphysical Systems Set ; _vVolume 10
505	0		_aMeasurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
588	0		_aOnline resource; title from PDF title page (John Wiley, viewed May 7, 2021).
590			_bWiley Frontlist Obook All English 2021
650		0	_aMetrology. _96667
655		4	_aElectronic books. _93294
700	1		_aPougnet, Philippe, _eauthor. _99559
700	1		_aEl Hami, Abdelkhalak, _eauthor. _96639
830		0	_aReliability of multiphysical systems set ; _vv. 10. _99900
856	4	0	_uhttps://doi.org/10.1002/9781119818984 _zWiley Online Library
942			_cEBK
994			_a92 _bDG1
999			_c69543 _d69543