000 01620cam a2200397Ii 4500
001 9780429225611
008 180420s20162016fluad ob 001 0 eng d
020 _a9780429225611
_q(e-book : PDF)
020 _a9781317287339
_q(e-book: Mobi)
020 _a9781317287346
_q(e-book: ePub)
020 _a9781317287353
_q(e-book: PDF)
020 _z9781138029125
_q(hardback)
020 _z9781138612075
_q(paperback)
024 7 _a10.1201/b20022
_2doi
035 _a(OCoLC)949226742
040 _aFlBoTFG
_cFlBoTFG
_erda
050 4 _aTK7871.99.M44
_bS87 2016
082 0 4 _a621.39732
_bS964
100 1 _aSuss, Andreas,
_eauthor.
_912114
245 1 0 _aHigh performance CMOS range imaging :
_bdevice technology and systems considerations /
_cAndreas Suss.
264 1 _aBoca Raton :
_bCRC Press,
_c[2016].
264 4 _c©2016
300 _a1 online resource.
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
490 1 _aDevices, circuits, and systems
500 _aA Balkema book.
505 0 _a1. Introduction -- 2. State of the art range imaging -- 3. Temporal noise -- 4. Noise performance of devices available in the 0.35 um CMOS process -- 5. Noise in active pixel sensors -- 6. On the design of PM-ToF range imagers -- 7. Conclusions.
650 0 _aMetal oxide semiconductors, Complementary.
_93260
650 0 _aImaging systems.
_95595
776 0 8 _iPrint version:
_z9781138029125
830 0 _aDevices, circuits, and systems.
_912115
856 4 0 _uhttps://www.taylorfrancis.com/books/9781315643885
_zClick here to view.
942 _cEBK
999 _c70151
_d70151