000 01795cam a2200337Ii 4500
001 9781315216911
008 180331s2013 fluad ob 001 0 eng d
020 _a9781315216911
_q(e-book : PDF)
020 _a9781351824118
_q(e-book: Mobi)
020 _a9781439874318
_q(e-book: PDF)
020 _z9781439874301
_q(hardback)
020 _z9781138074224
_q(paperback)
024 7 _a10.1201/b13001
_2doi
035 _a(OCoLC)830851254
050 4 _aTK7870.24
_b.E97 2013
082 0 4 _a621.381
_bE969
245 0 0 _aExtreme environment electronics /
_cedited by John D. Cressler, H. Alan Mantooth.
264 1 _aBoca Raton :
_bCRC Press,
_c2013.
300 _a1 online resource (xxiv, 1009 pages)
490 1 _aIndustrial electronics
505 0 _apt. 1. Introduction -- pt. 2. Background -- pt. 3. Environments and prediction tools -- pt. 4. Semiconductor device technologies for extreme environments -- pt. 5. Modeling for extreme environment electronic design -- pt. 6. Device and circuit reliability in extreme environments -- pt. 7. Circuit design for extreme environments -- pt. 8. Examples of extreme environment circuit designs -- pt. 9. Verification of analog and mixed-signal systems -- pt. 10. Packaging for extreme environments -- pt. 11. Real-world extreme environment applications -- pt. 12. Appendices.
650 0 _aElectronic apparatus and appliances
_xReliability.
_917554
650 0 _aExtreme environments.
_96946
650 0 _aEnvironmental testing.
_917555
700 1 _aCressler, John D.
_914058
700 1 _aMantooth, H. Alan,
_d1963-
_917556
776 0 8 _iPrint version:
_z9781439874301
_w(DLC) 2012015406
830 0 _aIndustrial electronics series.
_917557
856 4 0 _uhttps://www.taylorfrancis.com/books/9781315216911
_zClick here to view.
942 _cEBK
999 _c71559
_d71559