000 | 01795cam a2200337Ii 4500 | ||
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001 | 9781315216911 | ||
008 | 180331s2013 fluad ob 001 0 eng d | ||
020 |
_a9781315216911 _q(e-book : PDF) |
||
020 |
_a9781351824118 _q(e-book: Mobi) |
||
020 |
_a9781439874318 _q(e-book: PDF) |
||
020 |
_z9781439874301 _q(hardback) |
||
020 |
_z9781138074224 _q(paperback) |
||
024 | 7 |
_a10.1201/b13001 _2doi |
|
035 | _a(OCoLC)830851254 | ||
050 | 4 |
_aTK7870.24 _b.E97 2013 |
|
082 | 0 | 4 |
_a621.381 _bE969 |
245 | 0 | 0 |
_aExtreme environment electronics / _cedited by John D. Cressler, H. Alan Mantooth. |
264 | 1 |
_aBoca Raton : _bCRC Press, _c2013. |
|
300 | _a1 online resource (xxiv, 1009 pages) | ||
490 | 1 | _aIndustrial electronics | |
505 | 0 | _apt. 1. Introduction -- pt. 2. Background -- pt. 3. Environments and prediction tools -- pt. 4. Semiconductor device technologies for extreme environments -- pt. 5. Modeling for extreme environment electronic design -- pt. 6. Device and circuit reliability in extreme environments -- pt. 7. Circuit design for extreme environments -- pt. 8. Examples of extreme environment circuit designs -- pt. 9. Verification of analog and mixed-signal systems -- pt. 10. Packaging for extreme environments -- pt. 11. Real-world extreme environment applications -- pt. 12. Appendices. | |
650 | 0 |
_aElectronic apparatus and appliances _xReliability. _917554 |
|
650 | 0 |
_aExtreme environments. _96946 |
|
650 | 0 |
_aEnvironmental testing. _917555 |
|
700 | 1 |
_aCressler, John D. _914058 |
|
700 | 1 |
_aMantooth, H. Alan, _d1963- _917556 |
|
776 | 0 | 8 |
_iPrint version: _z9781439874301 _w(DLC) 2012015406 |
830 | 0 |
_aIndustrial electronics series. _917557 |
|
856 | 4 | 0 |
_uhttps://www.taylorfrancis.com/books/9781315216911 _zClick here to view. |
942 | _cEBK | ||
999 |
_c71559 _d71559 |