| 000 | 01494cam a2200373Ii 4500 | ||
|---|---|---|---|
| 001 | 9781315368948 | ||
| 008 | 180706t20172017fluad ob 001 0 eng d | ||
| 020 |
_a9781315368948 _q(e-book : PDF) |
||
| 020 |
_a9781315332901 _q(e-book: Mobi) |
||
| 020 |
_z9781498743808 _q(hardback) |
||
| 024 | 7 |
_a10.1201/9781315368948 _2doi |
|
| 035 | _a(OCoLC)966358842 | ||
| 040 |
_aFlBoTFG _cFlBoTFG _erda |
||
| 050 | 4 |
_aTK7871.85 _b.S449 2017 |
|
| 082 | 0 | 4 |
_a621.38152 _bS471 |
| 245 | 0 | 0 |
_aSemiconductor devices in harsh conditions / _cedited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski. |
| 264 | 1 |
_aBoca Raton : _bCRC Press, _c[2017] |
|
| 264 | 4 | _c©2017 | |
| 300 | _a1 online resource | ||
| 336 |
_atext _2rdacontent |
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| 337 |
_acomputer _2rdamedia |
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| 338 |
_aonline resource _2rdacarrier |
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| 490 | 1 | _aDevices, circuits, and systems | |
| 505 | 0 | _asection I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design. | |
| 650 | 0 |
_aSemiconductors _xReliability. _920158 |
|
| 650 | 0 |
_aExtreme environments. _96946 |
|
| 650 | 0 |
_aEnvironmental testing. _917555 |
|
| 700 | 1 |
_aChrzanowska-Jeske, Malgorzata, _eeditor. _920159 |
|
| 700 | 1 |
_aWeide-Zaage, Kirsten, _eeditor. _920160 |
|
| 776 | 0 | 8 |
_iPrint version: _z9781498743808 _w(DLC) 2016022751 |
| 830 | 0 |
_aDevices, circuits, and systems. _912115 |
|
| 856 | 4 | 0 |
_uhttps://www.taylorfrancis.com/books/9781315368948 _zClick here to view. |
| 942 | _cEBK | ||
| 999 |
_c72305 _d72305 |
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