000			02141cam a2200373Ii 4500
001			9781351227780
008			180706s2018 fluab ob 001 0 eng d
020			_a9781351227780 _q(e-book : PDF)
024	7		_a10.1201/9781351227780 _2doi
035			_a(OCoLC)1012343556
050		4	_aTK7874.75
072		7	_aTEC _x008000 _2bisacsh
072		7	_aTEC _x008010 _2bisacsh
072		7	_aTEC _x008070 _2bisacsh
072		7	_aTJFC _2bicscc
082	0	4	_a621.39/50287 _223
100	1		_aChattopadhyay, Santanu, _eauthor. _920439
245	1	0	_aThermal-aware testing of digital vlsi circuits and systems / _cby Santanu Chattopadhyay.
250			_aFirst edition.
264		1	_aBoca Raton, FL : _bCRC Press, an imprint of Taylor and Francis, _c2018.
300			_a1 online resource (138 pages) : _b10 illustrations
505	0	0	_tchapter 1 VLSI Testing -- _tAn Introduction / _rSantanu Chattopadhyay -- _tchapter 2 Circuit-Level Testing / _rSantanu Chattopadhyay -- _tchapter 3 Test-Data Compression / _rSantanu Chattopadhyay -- _tchapter 4 System-on-Chip Testing / _rSantanu Chattopadhyay -- _tchapter 5 Network-on-Chip Testing / _rSantanu Chattopadhyay.
520	3		_aThis book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
650		0	_aDigital integrated circuits _xTesting. _920440
650		0	_aIntegrated circuits _xVery large scale integration _xTesting. _920441
650		0	_aIntegrated circuits _xVery large scale integration _xThermal properties. _920442
650		0	_aTemperature measurements. _917833
650		7	_aTECHNOLOGY & ENGINEERING / Electronics / Circuits / General. _2bisacsh _920443
650		7	_aTECHNOLOGY & ENGINEERING / Electronics / Microelectronics. _2bisacsh _920444
710	2		_aTaylor and Francis. _910719
776	0	8	_iPrint version: _z9780815378822 _w(DLC) 2018002053
856	4	0	_uhttps://www.taylorfrancis.com/books/9781351227780 _zClick here to view.
942			_cEBK
999			_c72381 _d72381