000 02555nmm a2200397Ia 4500
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007 cr |uu|||uu|||
008 190107s2018 si a ob 001 0 eng c
010 _z 2017010454
040 _aWSPC
_beng
_cWSPC
020 _a9789814571746
_q(ebook)
020 _z9789814571722
_q(hbk.)
020 _z9789814571739
_q(pbk.)
050 0 4 _aTK7871.99.M44
_bL86 2018
072 7 _aTEC
_x008010
_2bisacsh
072 7 _aTEC
_x009100
_2bisacsh
072 7 _aTEC
_x009110
_2bisacsh
082 0 4 _a621.3815/284
_223
100 1 _aLundstrom, Mark S.
_920808
245 1 0 _aFundamentals of nanotransistors
_h[electronic resource] /
_cMark Lundstrom.
260 _aSingapore :
_bWorld Scientific Publishing Co. Pte Ltd.,
_c©2018.
300 _a1 online resource (388 p.) :
_bill.
490 0 _aLessons from nanoscience: a lecture notes series ;
_vv. 6
538 _aSystem requirements: Adobe Acrobat Reader.
538 _aMode of access: World Wide Web.
588 _aTitle from web page (viewed January 17, 2019).
504 _aIncludes bibliographical references and index.
520 _a"The transistor is the key enabler of modern electronics. Progress in transistor scaling has pushed channel lengths to the nanometer regime where traditional approaches to device physics are less and less suitable. These lectures describe a way of understanding MOSFETs and other transistors that is much more suitable than traditional approaches when the critical dimensions are measured in nanometers. It uses a novel, "bottom-up approach" that agrees with traditional methods when devices are large, but that also works for nano-devices. Surprisingly, the final result looks much like the traditional, textbook, transistor models, but the parameters in the equations have simple, clear interpretations at the nanoscale. The objective is to provide readers with an understanding of the essential physics of nanoscale transistors as well as some of the practical technological considerations and fundamental limits. This book is written in a way that is broadly accessible to students with only a very basic knowledge of semiconductor physics and electronic circuits."--
_cPublisher's website.
650 0 _aMetal oxide semiconductor field-effect transistors.
_915501
650 0 _aNanostructured materials.
_94537
650 0 _aElectronic books.
_920809
856 4 0 _uhttps://www.worldscientific.com/worldscibooks/10.1142/9018#t=toc
_zAccess to full text is restricted to subscribers.
942 _cEBK
999 _c72642
_d72642