| 000 | 05074nam a2201273 i 4500 | ||
|---|---|---|---|
| 001 | 5264205 | ||
| 003 | IEEE | ||
| 005 | 20220712205646.0 | ||
| 006 | m o d | ||
| 007 | cr |n||||||||| | ||
| 008 | 151221s1998 nyu ob 001 eng d | ||
| 020 |
_a9780470546512 _qelectronic |
||
| 020 |
_z9780780310759 _qprint |
||
| 020 |
_z0470546514 _qelectronic |
||
| 024 | 7 |
_a10.1109/9780470546512 _2doi |
|
| 035 | _a(CaBNVSL)mat05264205 | ||
| 035 | _a(IDAMS)0b000064810c40d1 | ||
| 040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
||
| 050 | 4 |
_aTK7874 _b.S876 1998eb |
|
| 082 | 0 | 4 |
_a621.3815 _222 |
| 245 | 0 | 0 |
_aSymbolic analysis techniques : _bapplications to analog design automation / _cedited by Francisco V. Fern�andez ... [et al.]. |
| 264 | 1 |
_aNew York : _bIEEE Press, _cc1998. |
|
| 264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[1998] |
|
| 300 | _a1 PDF (xix, 390 pages). | ||
| 336 |
_atext _2rdacontent |
||
| 337 |
_aelectronic _2isbdmedia |
||
| 338 |
_aonline resource _2rdacarrier |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _aPreface. Acknowledgments. Introduction. Symbolic Analysis Techniques: A Review. Symbolic Analysis of Sampled-Data Systems. Symbolic Analysis of Switched Analog Circuits. Hierarchical Symbolic Analysis of Large Analog Circuits. Symbolic Formula Approximation. Symbolic Analysis of Weakly Nonlinear Analog Integrated Circuits. Structural Synthesis and Optimization of Analog Circuits. Automated Analog Design Using Compiled Symbolic Models. Symbolic Signal Flow Graph Methods in Switched-Capacitor Design. Symbolic Methods in Semiconductor Parameter Extraction. Statistical Delay Characterization of CMOS Digital Combinational Circuits. Analog Testability and Fault Diagnosis Using Symbolic Analysis. Index. About the Editors. | |
| 506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
| 520 | _aThis timely, self-contained volume gathers information disseminated from journals, workshops, and conference proceedings to present the most recent and most important applications of symbolic analysis to analog circuit design. It features an in-depth tutorial introduction to the techniques and algorithms underlying modern symbolic analyzers, and includes exhaustive references at the end of each section. | ||
| 530 | _aAlso available in print. | ||
| 538 | _aMode of access: World Wide Web | ||
| 588 | _aDescription based on PDF viewed 12/21/2015. | ||
| 650 | 0 |
_aLinear integrated circuits _xDesign and construction _xData processing. _926816 |
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| 650 | 0 |
_aSymbolic circuit analysis. _926817 |
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| 655 | 0 |
_aElectronic books. _93294 |
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| 695 | _aAdmittance | ||
| 695 | _aAlgorithm design and analysis | ||
| 695 | _aAnalog circuits | ||
| 695 | _aAnalog integrated circuits | ||
| 695 | _aAnalytical models | ||
| 695 | _aApproximation methods | ||
| 695 | _aBinary trees | ||
| 695 | _aBiographies | ||
| 695 | _aBiological system modeling | ||
| 695 | _aBismuth | ||
| 695 | _aCapacitance | ||
| 695 | _aCapacitors | ||
| 695 | _aCircuit faults | ||
| 695 | _aCircuit synthesis | ||
| 695 | _aClassification algorithms | ||
| 695 | _aClocks | ||
| 695 | _aClosed-form solution | ||
| 695 | _aComplexity theory | ||
| 695 | _aConsumer electronics | ||
| 695 | _aCost function | ||
| 695 | _aData mining | ||
| 695 | _aData models | ||
| 695 | _aDelay | ||
| 695 | _aDesign automation | ||
| 695 | _aEquations | ||
| 695 | _aFault diagnosis | ||
| 695 | _aFeedback amplifier | ||
| 695 | _aFinite element methods | ||
| 695 | _aFrequency domain analysis | ||
| 695 | _aHarmonic analysis | ||
| 695 | _aIndexes | ||
| 695 | _aIntegrated circuit modeling | ||
| 695 | _aKernel | ||
| 695 | _aKnowledge based systems | ||
| 695 | _aLayout | ||
| 695 | _aMOSFETs | ||
| 695 | _aMathematical model | ||
| 695 | _aMatrices | ||
| 695 | _aMemory management | ||
| 695 | _aMinimization | ||
| 695 | _aMixers | ||
| 695 | _aNumerical analysis | ||
| 695 | _aNumerical models | ||
| 695 | _aOptimization | ||
| 695 | _aParameter extraction | ||
| 695 | _aPartitioning algorithms | ||
| 695 | _aPolynomials | ||
| 695 | _aRLC circuits | ||
| 695 | _aResonant frequency | ||
| 695 | _aSearch problems | ||
| 695 | _aSections | ||
| 695 | _aSemiconductor device measurement | ||
| 695 | _aSemiconductor device modeling | ||
| 695 | _aSoftware | ||
| 695 | _aSolid modeling | ||
| 695 | _aSparse matrices | ||
| 695 | _aSteady-state | ||
| 695 | _aSwitches | ||
| 695 | _aSwitching circuits | ||
| 695 | _aSynchronization | ||
| 695 | _aSystematics | ||
| 695 | _aTesting | ||
| 695 | _aTopology | ||
| 695 | _aTransfer functions | ||
| 695 | _aTransistors | ||
| 700 | 1 |
_aFern�andez, Francisco V., _d1965- _926818 |
|
| 710 | 2 |
_aJohn Wiley & Sons, _epublisher. _96902 |
|
| 710 | 2 |
_aIEEE Xplore (Online service), _edistributor. _926819 |
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| 776 | 0 | 8 |
_iPrint version: _z9780780310759 |
| 856 | 4 | 2 |
_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264205 |
| 942 | _cEBK | ||
| 999 |
_c73888 _d73888 |
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