000			06588nam a2201213 i 4500
001			5361037
003			IEEE
005			20220712205730.0
006			m o d
007			cr |n|||||||||
008			091105t20152009njua o 000 0 eng d
020			_a9780470495070 _qelectronic
020			_z9780470397046 _qprint
020			_z0470495073 _qelectronic
024	7		_a10.1002/9780470495070 _2doi
035			_a(CaBNVSL)mat05361037
035			_a(IDAMS)0b00006481178851
040			_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL
050		4	_aTK7870 _b.M324 2009eb
082	0	4	_a621.317 _222
100	1		_aMardiguian, Michel, _eauthor. _927355
245	1	0	_aElectrostatic discharge : _bunderstand, simulate and fix ESD problems / _cMichel Mardiguian.
250			_a3rd ed.
264		1	_aPiscataway, New Jersey : _bIEEE Press, _c2009.
264		2	_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[2009]
300			_a1 PDF (xii, 299 pages) : _billustrations.
336			_atext _2rdacontent
337			_aelectronic _2isbdmedia
338			_aonline resource _2rdacarrier
505	0		_aPreface to the First Edition -- Preface to the Third Edition -- Acknowledgements -- 1. The Electrostatic Discharge Phenomenon -- 1.1. Physics Involved -- 1.2. Influencing Parameters -- 1.3. Various Types of Electrostatic Charging with Humans and Objects -- 1.4. Statistics of Voltages and Currents Reached During ESD -- 1.5. Waveforms of Electrostatic Discharges -- References -- 2. Effects of ESD on Electronics -- 2.1. Direct Discharge to an Electronic Component -- 2.2. Direct Discharge to Electronic Equipment Enclosure -- 2.3. Indirect Discharge -- 2.4. Coupling Mechanisms of ESD Pulse into the Victim's Circuitry -- 2.5. Response of Victim Circuits and Type of Errors -- 2.6. Prediction of Actual ESD-Induced Error, Fast Approximation Method -- 2.7. Remarks on the Actual Current Paths and Associated Radiation -- 2.8. Personnel or Furniture ESD: Which One is Worse? -- References -- 3. Principal ESD Specifications -- 3.1. ESD Test Specifications for Device Sensitivity -- 3.2. ESD Specifications for Equipment Immunity -- 3.3. Antistatic Control Procedures -- References. -- 4. ESD Diagnostics and Testing. -- 4.1. ESD Simulators: How They Work -- 4.2. Furniture Versus Personnel ESD Simulation -- 4.3. Other Types of ESD Simulators for Component Testing -- 4.4. ESD Test Setup--Direct and Indirect ESD -- 4.5. ESD Test Routine and Discharge Procedures -- 4.6. No Error/No Damage Concept: The Several Layers of Severity -- 4.7. The Error per Discharge Concept or Multiple-Trials Approach -- 4.8. ESD Test During Design and Development -- 4.9. ESD For Field Diagnostics and Forced Crash Method -- 4.10. Home-Made Investigation Tools and Diagnostic Hints -- References -- 5. Design for ESD Immunity -- 5.1. ESD Protection at Component Level -- 5.2. ESD Protection at the PCB Level (Internal Circuitry) -- 5.3. ESD Protection by Internal Wiring and Mechanical Packaging -- 5.4. ESD Protection by Box Shielding and Envelope Design -- 5.5. ESD Protection of External Cables and I/O Ports -- 5.6. ESD Immunity by Software and Noise Inhibition Techniques.
505	8		_a5.7. ESD Immunity with Miniature, Portable Devices -- 5.8. System ESD Immunity -- 5.9. ESD Control at Installation Level -- References -- 6. ESD Cases Studies -- 6.1. Case 1: The Reradiating Ground Strap -- 6.2. Case 2: ESD Hardening of a Printer -- 6.3. Case 3: The Data Terminal with Floating Tray -- 6.4. Case 4: The Safety Wire "Antenna" -- 6.5. Case 5: The Touchy Watchdog -- 6.6. Case 6: The Trigger-Happy Air bag Initiator -- 6.7. Conclusion: Troubleshooting Hints -- Appendix A. ESD Protection by Design of Chips and Microcircuits -- Appendix B. Prediction of ESD Damage Level for a Semiconductor Junction -- Appendix C. Spark-Over Voltages -- Appendix D. Fatigue Phenomena During Repeated ESD Testing -- Appendix E. Prediction of ESD-Induced Noise by Fast Frequency- Domain Calculations -- Appendix F. More Experiments on ESD Coupling to Boxes -- Appendix G. Examples of Simple SPICE Modeling of ESD Coupling Effects -- Appendix H. Time-to-Frequency Conversion for a Single Transient -- Index.
506	1		_aRestricted to subscribers or individual electronic text purchasers.
530			_aAlso available in print.
538			_aMode of access: World Wide Web
588			_aDescription based on PDF viewed 12/21/2015.
650		0	_aElectronic apparatus and appliances _xProtection. _99254
650		0	_aElectric discharges. _99255
650		0	_aElectrostatics. _92422
655		0	_aElectronic books. _93294
695			_aSensitivity
695			_aSurface discharges
695			_aSurges
695			_aSwitches
695			_aSystem-on-a-chip
695			_aTesting
695			_aTime domain analysis
695			_aTime frequency analysis
695			_aTransient analysis
695			_aTransistors
695			_aVaristors
695			_aWire
695			_aAcceleration
695			_aAtmospheric modeling
695			_aBiological system modeling
695			_aCable shielding
695			_aCapacitance
695			_aCapacitors
695			_aClamps
695			_aConductors
695			_aConnectors
695			_aContacts
695			_aCouplings
695			_aCurrent density
695			_aCurrent measurement
695			_aDischarges
695			_aElectrodes
695			_aElectromagnetic interference
695			_aElectronic components
695			_aElectrostatic discharge
695			_aElectrostatics
695			_aEquations
695			_aFatigue
695			_aFourier series
695			_aGrounding
695			_aHeating
695			_aIEC standards
695			_aImmune system
695			_aIndexes
695			_aIntegrated circuit modeling
695			_aIntegrated circuits
695			_aIons
695			_aJunctions
695			_aLead
695			_aLogic gates
695			_aManufacturing
695			_aMaterials
695			_aMathematical model
695			_aMetals
695			_aNeedles
695			_aNoise
695			_aPaints
695			_aPhysics
695			_aProbes
695			_aRails
695			_aResistance
695			_aResistors
695			_aSPICE
695			_aSchottky diodes
710	2		_aJohn Wiley & Sons, _epublisher. _96902
710	2		_aIEEE Xplore (Online service), _edistributor. _927356
776	0	8	_iPrint version: _z9780470397046
856	4	2	_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
942			_cEBK
999			_c74040 _d74040