000 03440nam a22005055i 4500
001 978-3-030-15085-3
003 DE-He213
005 20220801213556.0
007 cr nn 008mamaa
008 190807s2020 sz | s |||| 0|eng d
020 _a9783030150853
_9978-3-030-15085-3
024 7 _a10.1007/978-3-030-15085-3
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aEl-Kareh, Badih.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_932960
245 1 0 _aSilicon Analog Components
_h[electronic resource] :
_bDevice Design, Process Integration, Characterization, and Reliability /
_cby Badih El-Kareh, Lou N. Hutter.
250 _a2nd ed. 2020.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2020.
300 _aXLIX, 648 p. 473 illus., 272 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aThe World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- Analog/RF CMOS -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.
520 _aThis book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science. Enables engineers to understand analog device physics, and discusses important relations between process integration, device design, component characteristics, and reliability; Describes in step-by-step fashion the components that are used in analog designs, the particular characteristics of analog components, while comparing them to digital applications; Explains the second-order effects in analog devices, and trade-offs between these effects when designing components and developing an integrated process for their manufacturing.
650 0 _aElectronic circuits.
_919581
650 0 _aOptical materials.
_97729
650 1 4 _aElectronic Circuits and Systems.
_932961
650 2 4 _aOptical Materials.
_97729
700 1 _aHutter, Lou N.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_932962
710 2 _aSpringerLink (Online service)
_932963
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783030150846
776 0 8 _iPrinted edition:
_z9783030150860
776 0 8 _iPrinted edition:
_z9783030150877
856 4 0 _uhttps://doi.org/10.1007/978-3-030-15085-3
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c75344
_d75344