000 02508nam a22004815i 4500
001 978-3-030-37500-3
003 DE-He213
005 20220801214437.0
007 cr nn 008mamaa
008 200426s2020 sz | s |||| 0|eng d
020 _a9783030375003
_9978-3-030-37500-3
024 7 _a10.1007/978-3-030-37500-3
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
245 1 0 _aNoise in Nanoscale Semiconductor Devices
_h[electronic resource] /
_cedited by Tibor Grasser.
250 _a1st ed. 2020.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2020.
300 _aVI, 729 p. 550 illus., 443 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
520 _aThis book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
650 0 _aElectronic circuits.
_919581
650 0 _aElectronics.
_93425
650 1 4 _aElectronic Circuits and Systems.
_938388
650 2 4 _aElectronics and Microelectronics, Instrumentation.
_932249
700 1 _aGrasser, Tibor.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
_938389
710 2 _aSpringerLink (Online service)
_938390
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783030374990
776 0 8 _iPrinted edition:
_z9783030375010
776 0 8 _iPrinted edition:
_z9783030375027
856 4 0 _uhttps://doi.org/10.1007/978-3-030-37500-3
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c76353
_d76353