| 000 | 04724nam a22005535i 4500 | ||
|---|---|---|---|
| 001 | 978-3-030-68368-9 | ||
| 003 | DE-He213 | ||
| 005 | 20220801214451.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 210310s2021 sz | s |||| 0|eng d | ||
| 020 |
_a9783030683689 _9978-3-030-68368-9 |
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| 024 | 7 |
_a10.1007/978-3-030-68368-9 _2doi |
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| 050 | 4 | _aTK7867-7867.5 | |
| 072 | 7 |
_aTJFC _2bicssc |
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_aTEC008010 _2bisacsh |
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| 072 | 7 |
_aTJFC _2thema |
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| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 |
_aZimpeck, Alexandra. _eauthor. _0(orcid)0000-0002-3583-1002 _1https://orcid.org/0000-0002-3583-1002 _4aut _4http://id.loc.gov/vocabulary/relators/aut _938527 |
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| 245 | 1 | 0 |
_aMitigating Process Variability and Soft Errors at Circuit-Level for FinFETs _h[electronic resource] / _cby Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis. |
| 250 | _a1st ed. 2021. | ||
| 264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2021. |
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| 300 |
_aXIII, 131 p. 89 illus., 86 illus. in color. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 505 | 0 | _aChapter 1. Introduction -- Chapter 2. FinFET Technology -- Chapter 3. Reliability Challenges in FinFETs -- Chapter 4. Circuit-Level Mitigation Approaches -- Chapter 5. Evaluation Methodology -- Chapter 6. Process Variability Mitigation -- Chapter 7. Soft Error Mitigation -- Chapter 8. General Trade-offs -- Chapter 9. Final Remarks. | |
| 520 | _aThis book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section. Explains how to measure the influence of process variability (e.g. work-function fluctuations) and radiation-induced soft errors in FinFET logic cells; Enables designers to improve the robustness of FinFET integrated circuits without focusing on manufacturing adjustments; Discusses the benefits and downsides of using circuit-level approaches such as transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor for mitigating the impact of process variability and soft errors; Evaluates the techniques described in the context of different test scenarios: distinct levels of process variations, transistor sizing, and different radiation features; Helps readers identify the best circuit design considering the target application and design requirements like area constraints or power/delay limitations. | ||
| 650 | 0 |
_aElectronic circuits. _919581 |
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| 650 | 0 |
_aElectronic circuit design. _94185 |
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| 650 | 0 |
_aSolid state physics. _93235 |
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| 650 | 1 | 4 |
_aElectronic Circuits and Systems. _938528 |
| 650 | 2 | 4 |
_aElectronics Design and Verification. _938529 |
| 650 | 2 | 4 |
_aElectronic Devices. _938530 |
| 700 | 1 |
_aMeinhardt, Cristina. _eauthor. _0(orcid)0000-0003-1088-1000 _1https://orcid.org/0000-0003-1088-1000 _4aut _4http://id.loc.gov/vocabulary/relators/aut _938531 |
|
| 700 | 1 |
_aArtola, Laurent. _eauthor. _0(orcid)0000-0003-0730-7518 _1https://orcid.org/0000-0003-0730-7518 _4aut _4http://id.loc.gov/vocabulary/relators/aut _938532 |
|
| 700 | 1 |
_aReis, Ricardo. _eauthor. _0(orcid)0000-0001-5781-5858 _1https://orcid.org/0000-0001-5781-5858 _4aut _4http://id.loc.gov/vocabulary/relators/aut _938533 |
|
| 710 | 2 |
_aSpringerLink (Online service) _938534 |
|
| 773 | 0 | _tSpringer Nature eBook | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030683672 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030683696 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030683702 |
| 856 | 4 | 0 | _uhttps://doi.org/10.1007/978-3-030-68368-9 |
| 912 | _aZDB-2-ENG | ||
| 912 | _aZDB-2-SXE | ||
| 942 | _cEBK | ||
| 999 |
_c76378 _d76378 |
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