| 000 | 03802nam a22005415i 4500 | ||
|---|---|---|---|
| 001 | 978-3-030-29353-6 | ||
| 003 | DE-He213 | ||
| 005 | 20220801214521.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 190930s2020 sz | s |||| 0|eng d | ||
| 020 |
_a9783030293536 _9978-3-030-29353-6 |
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| 024 | 7 |
_a10.1007/978-3-030-29353-6 _2doi |
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| 050 | 4 | _aTK7867-7867.5 | |
| 072 | 7 |
_aTJFC _2bicssc |
|
| 072 | 7 |
_aTEC008010 _2bisacsh |
|
| 072 | 7 |
_aTJFC _2thema |
|
| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 |
_aBastos, Rodrigo Possamai. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _938829 |
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| 245 | 1 | 0 |
_aOn-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits _h[electronic resource] / _cby Rodrigo Possamai Bastos, Frank Sill Torres. |
| 250 | _a1st ed. 2020. | ||
| 264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2020. |
|
| 300 |
_aXXXII, 162 p. 80 illus., 50 illus. in color. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 505 | 0 | _aChapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans. | |
| 520 | _aThis book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. Presents a unique approach for detection of radiation-induced transient faults in integrated circuits; Describes the effects of ionizing particles in the transistor body and discusses its exploitation; Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications. | ||
| 650 | 0 |
_aElectronic circuits. _919581 |
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| 650 | 0 |
_aMicroprocessors. _938830 |
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| 650 | 0 |
_aComputer architecture. _93513 |
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| 650 | 0 |
_aElectronics. _93425 |
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| 650 | 1 | 4 |
_aElectronic Circuits and Systems. _938831 |
| 650 | 2 | 4 |
_aProcessor Architectures. _938832 |
| 650 | 2 | 4 |
_aElectronics and Microelectronics, Instrumentation. _932249 |
| 700 | 1 |
_aTorres, Frank Sill. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _938833 |
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| 710 | 2 |
_aSpringerLink (Online service) _938834 |
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| 773 | 0 | _tSpringer Nature eBook | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030293529 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030293543 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030293550 |
| 856 | 4 | 0 | _uhttps://doi.org/10.1007/978-3-030-29353-6 |
| 912 | _aZDB-2-ENG | ||
| 912 | _aZDB-2-SXE | ||
| 942 | _cEBK | ||
| 999 |
_c76432 _d76432 |
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