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001 978-3-030-39284-0
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008 200319s2020 sz | s |||| 0|eng d
020 _a9783030392840
_9978-3-030-39284-0
024 7 _a10.1007/978-3-030-39284-0
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aLienig, Jens.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_938939
245 1 0 _aFundamentals of Layout Design for Electronic Circuits
_h[electronic resource] /
_cby Jens Lienig, Juergen Scheible.
250 _a1st ed. 2020.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2020.
300 _aXV, 306 p. 220 illus., 215 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- Technology Know-How: From Silicon to Devices -- Bridges to Technology: Interfaces, Design Rules and Libraries -- Methodologies for Physical Design: Models, Styles, Tasks, and Flows -- Steps in Physical Design: From Netlist to Layout Post Processing -- Special Layout Techniques for Analog IC Design -- Addressing Reliability in Physical Design. .
520 _aThis book covers the fundamental knowledge of layout design from the ground up, addressing both physical design, as generally applied to digital circuits, and analog layout. Such knowledge provides the critical awareness and insights a layout designer must possess to convert a structural description produced during circuit design into the physical layout used for IC/PCB fabrication. The book introduces the technological know-how to transform silicon into functional devices, to understand the technology for which a layout is targeted (Chap. 2). Using this core technology knowledge as the foundation, subsequent chapters delve deeper into specific constraints and aspects of physical design, such as interfaces, design rules and libraries (Chap. 3), design flows and models (Chap. 4), design steps (Chap. 5), analog design specifics (Chap. 6), and finally reliability measures (Chap. 7). Besides serving as a textbook for engineering students, this book is a foundational reference for today’s circuit designers. For Slides and Other Information: https://www.ifte.de/books/pd/index.html This is a welcome and very important new reference book for both students and practicing microelectronics design engineers. It fills a gap in pedagogy that has been growing over time, by building from foundations while spanning layers of system architecture and integration, as well as both analog and digital layout. Professor Andrew B. Kahng, University of California San Diego This book is an excellent introduction, covering where we are now, the key problems we currently face, and also providing a glimpse of what is to come. The authors are respected leaders in the field, with deep knowledge; they cover the material in a crisp and clear manner, making this text a great resource for anyone, from the new student to the seasoned expert. Associate Professor Patrick H. Madden, Binghamton University This book covers fundamentals of IC mask or layout design with a strong emphasis on the technological background, the practical design and verification steps, and the analog and reliability issues. I find the book worth reading. It equips students and junior engineers with comprehensive layout design knowledge. Professor Mark Po-Hung Lin, National Chiao Tung University, Taiwan The combined expertise of the authors and the attention they have paid to theory and practice, big picture and detail, illustrative examples and written text, make this book the perfect go-to resource for students and engineers alike. Professor Laleh Behjat, University of Calgary.
650 0 _aElectronic circuits.
_919581
650 1 4 _aElectronic Circuits and Systems.
_938940
700 1 _aScheible, Juergen.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_938941
710 2 _aSpringerLink (Online service)
_938942
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783030392833
776 0 8 _iPrinted edition:
_z9783030392857
776 0 8 _iPrinted edition:
_z9783030392864
856 4 0 _uhttps://doi.org/10.1007/978-3-030-39284-0
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c76458
_d76458