000 | 03281nam a22005295i 4500 | ||
---|---|---|---|
001 | 978-3-030-23781-3 | ||
003 | DE-He213 | ||
005 | 20220801214712.0 | ||
007 | cr nn 008mamaa | ||
008 | 190930s2020 sz | s |||| 0|eng d | ||
020 |
_a9783030237813 _9978-3-030-23781-3 |
||
024 | 7 |
_a10.1007/978-3-030-23781-3 _2doi |
|
050 | 4 | _aTK7867-7867.5 | |
072 | 7 |
_aTJFC _2bicssc |
|
072 | 7 |
_aTEC008010 _2bisacsh |
|
072 | 7 |
_aTJFC _2thema |
|
082 | 0 | 4 |
_a621.3815 _223 |
245 | 1 | 0 |
_aAgeing of Integrated Circuits _h[electronic resource] : _bCauses, Effects and Mitigation Techniques / _cedited by Basel Halak. |
250 | _a1st ed. 2020. | ||
264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2020. |
|
300 |
_aXIII, 228 p. 145 illus., 107 illus. in color. _bonline resource. |
||
336 |
_atext _btxt _2rdacontent |
||
337 |
_acomputer _bc _2rdamedia |
||
338 |
_aonline resource _bcr _2rdacarrier |
||
347 |
_atext file _bPDF _2rda |
||
505 | 0 | _aChapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring. | |
520 | _aThis book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading. | ||
650 | 0 |
_aElectronic circuits. _919581 |
|
650 | 0 |
_aMicroprocessors. _939923 |
|
650 | 0 |
_aComputer architecture. _93513 |
|
650 | 0 |
_aElectronics. _93425 |
|
650 | 1 | 4 |
_aElectronic Circuits and Systems. _939924 |
650 | 2 | 4 |
_aProcessor Architectures. _939925 |
650 | 2 | 4 |
_aElectronics and Microelectronics, Instrumentation. _932249 |
700 | 1 |
_aHalak, Basel. _eeditor. _4edt _4http://id.loc.gov/vocabulary/relators/edt _939926 |
|
710 | 2 |
_aSpringerLink (Online service) _939927 |
|
773 | 0 | _tSpringer Nature eBook | |
776 | 0 | 8 |
_iPrinted edition: _z9783030237806 |
776 | 0 | 8 |
_iPrinted edition: _z9783030237820 |
776 | 0 | 8 |
_iPrinted edition: _z9783030237837 |
856 | 4 | 0 | _uhttps://doi.org/10.1007/978-3-030-23781-3 |
912 | _aZDB-2-ENG | ||
912 | _aZDB-2-SXE | ||
942 | _cEBK | ||
999 |
_c76651 _d76651 |