000 03834nam a22005415i 4500
001 978-3-030-31310-4
003 DE-He213
005 20220801215416.0
007 cr nn 008mamaa
008 191220s2020 sz | s |||| 0|eng d
020 _a9783030313104
_9978-3-030-31310-4
024 7 _a10.1007/978-3-030-31310-4
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aManna, Kanchan.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_944188
245 1 0 _aDesign and Test Strategies for 2D/3D Integration for NoC-based Multicore Architectures
_h[electronic resource] /
_cby Kanchan Manna, Jimson Mathew.
250 _a1st ed. 2020.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2020.
300 _aXII, 162 p. 31 illus., 8 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction to Network-on-Chip Designs and Tests -- Iterative Mapping with Through Silicon Via (TSV) placement for 3D-NoC-based multicore systems -- A constructive Heuristic for integrated mapping and TSV Placement for 3D-NoC-based multicore systems -- Discrete Particle Swarm Optimization for integrated mapping and TSV Placement for 3D-NoC-based multicore systems -- Temperature-aware application mapping strategy for 2D-NoC-based multicore systems -- Temperature-aware design strategy for 3D-NoC-based multicore systems -- Temperature-aware test strategy for 2D as well as 3D-NoC-based multicore systems.
520 _aThis book covers various aspects of optimization in design and testing of Network-on-Chip (NoC) based multicore systems. It gives a complete account of the state-of-the-art and emerging techniques for near optimal mapping and test scheduling for NoC-based multicores. The authors describe the use of the Integer Line Programming (ILP) technique for smaller benchmarks and a Particle Swarm Optimization (PSO) to get a near optimal mapping and test schedule for bigger benchmarks. The PSO-based approach is also augmented with several innovative techniques to get the best possible solution. The tradeoff between performance (communication or test time) of the system and thermal-safety is also discussed, based on designer specifications. Provides a single-source reference to design and test for circuit and system-level approaches to (NoC) based multicore systems; Gives a complete account of the state-of-the-art and emerging techniques for near optimal mapping and test scheduling in (NoC) based multicore systems; Organizes chapters systematically and hierarchically, rather than in an ad hoc manner, covering aspects of optimization in design and testing of Network-on-Chip (NoC) based multicore systems.
650 0 _aElectronic circuits.
_919581
650 0 _aMicroprocessors.
_944189
650 0 _aComputer architecture.
_93513
650 0 _aElectronics.
_93425
650 1 4 _aElectronic Circuits and Systems.
_944190
650 2 4 _aProcessor Architectures.
_944191
650 2 4 _aElectronics and Microelectronics, Instrumentation.
_932249
700 1 _aMathew, Jimson.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_944192
710 2 _aSpringerLink (Online service)
_944193
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783030313098
776 0 8 _iPrinted edition:
_z9783030313111
776 0 8 _iPrinted edition:
_z9783030313128
856 4 0 _uhttps://doi.org/10.1007/978-3-030-31310-4
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c77458
_d77458