000 03185nam a22005055i 4500
001 978-3-319-77718-4
003 DE-He213
005 20220801215433.0
007 cr nn 008mamaa
008 180403s2018 sz | s |||| 0|eng d
020 _a9783319777184
_9978-3-319-77718-4
024 7 _a10.1007/978-3-319-77718-4
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aZhuang, Yuming.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_944367
245 1 0 _aAccurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
_h[electronic resource] /
_cby Yuming Zhuang, Degang Chen.
250 _a1st ed. 2018.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2018.
300 _aXIV, 170 p. 89 illus., 88 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aChapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.
520 _aThis book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
650 0 _aElectronic circuits.
_919581
650 0 _aElectronics.
_93425
650 1 4 _aElectronic Circuits and Systems.
_944368
650 2 4 _aElectronics and Microelectronics, Instrumentation.
_932249
700 1 _aChen, Degang.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_944369
710 2 _aSpringerLink (Online service)
_944370
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783319777177
776 0 8 _iPrinted edition:
_z9783319777191
776 0 8 _iPrinted edition:
_z9783030085209
856 4 0 _uhttps://doi.org/10.1007/978-3-319-77718-4
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c77489
_d77489