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008 161026s2017 si | s |||| 0|eng d
020 _a9789811030321
_9978-981-10-3032-1
024 7 _a10.1007/978-981-10-3032-1
_2doi
050 4 _aTA349-359
072 7 _aTGMD
_2bicssc
072 7 _aSCI096000
_2bisacsh
072 7 _aTGMD
_2thema
082 0 4 _a620.105
_223
100 1 _aCui, Yinan.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_947145
245 1 4 _aThe Investigation of Plastic Behavior by Discrete Dislocation Dynamics for Single Crystal Pillar at Submicron Scale
_h[electronic resource] /
_cby Yinan Cui.
250 _a1st ed. 2017.
264 1 _aSingapore :
_bSpringer Nature Singapore :
_bImprint: Springer,
_c2017.
300 _aXIV, 131 p. 71 illus., 67 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Theses, Recognizing Outstanding Ph.D. Research,
_x2190-5061
520 _aThis thesis transports you to a wonderful and fascinating small-scale world and tells you the origin of several new phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning.
650 0 _aMechanics, Applied.
_93253
650 0 _aSolids.
_93750
650 0 _aMechanics.
_98758
650 0 _aMicrotechnology.
_928219
650 0 _aMicroelectromechanical systems.
_96063
650 1 4 _aSolid Mechanics.
_931612
650 2 4 _aClassical Mechanics.
_931661
650 2 4 _aMicrosystems and MEMS.
_947146
710 2 _aSpringerLink (Online service)
_947147
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9789811030314
776 0 8 _iPrinted edition:
_z9789811030338
776 0 8 _iPrinted edition:
_z9789811097690
830 0 _aSpringer Theses, Recognizing Outstanding Ph.D. Research,
_x2190-5061
_947148
856 4 0 _uhttps://doi.org/10.1007/978-981-10-3032-1
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c77984
_d77984