000 03959nam a22006255i 4500
001 978-3-319-77872-3
003 DE-He213
005 20220801220554.0
007 cr nn 008mamaa
008 180427s2018 sz | s |||| 0|eng d
020 _a9783319778723
_9978-3-319-77872-3
024 7 _a10.1007/978-3-319-77872-3
_2doi
050 4 _aTS1-2301
072 7 _aTGP
_2bicssc
072 7 _aTEC020000
_2bisacsh
072 7 _aTGP
_2thema
082 0 4 _a670
_223
100 1 _aSeok, Seonho.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_951080
245 1 0 _aAdvanced Packaging and Manufacturing Technology Based on Adhesion Engineering
_h[electronic resource] :
_bWafer-Level Transfer Packaging and Fabrication Techniques Using Interface Energy Control Method /
_cby Seonho Seok.
250 _a1st ed. 2018.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2018.
300 _aVIII, 115 p. 106 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Series in Advanced Manufacturing,
_x2196-1735
505 0 _aOverview of MEMS packaging technologies -- Adhesion control techniques for debonding -- FEM modeling of debonding -- Polymer cap transfer packaging technologies -- Thin film cap transfer packaging technology -- Other related manufacturing technologies. .
520 _aThis book introduces microelectromechanical systems (MEMS) packaging utilizing polymers or thin films – a new and unique packaging technology. It first investigates the relationship between applied load and opening displacement as a function of benzocyclobutene (BCB) cap size to find the debonding behavior, and then presents BCB cap deformation and stress development at different opening displacements as a function of BCB thickness, which is a criterion for BCB cap transfer failure. Transfer packaging techniques are attracting increasing interest because they deliver packaging caps, from carrier wafers to device wafers, and minimize the fabrication issues frequently encountered in thin-film or polymer cap encapsulation. The book describes very-low-loss polymer cap or thin-film-transfer techniques based on anti-adhesion coating methods for radio frequency (RF) (-MEMS) device packaging. Since the polymer caps are susceptible to deformation due to their relatively low mechanical stiffness during debonding of the carrier wafer, the book develops an appropriate finite element model (FEM) to simulate the debonding process occurring in the interface between Si carrier wafer and BCB cap. Lastly, it includes the load–displacement curve of different materials and presents a flexible polymer filter and a tunable filter as examples of the applications of the proposed technology.
650 0 _aManufactures.
_931642
650 0 _aNanotechnology.
_94707
650 0 _aMicrotechnology.
_928219
650 0 _aMicroelectromechanical systems.
_96063
650 0 _aMaterials—Analysis.
_951081
650 0 _aCoatings.
_96797
650 0 _aTribology.
_94149
650 1 4 _aMachines, Tools, Processes.
_931645
650 2 4 _aNanotechnology.
_94707
650 2 4 _aMicrosystems and MEMS.
_951082
650 2 4 _aCharacterization and Analytical Technique.
_951083
650 2 4 _aCoatings.
_96797
650 2 4 _aTribology.
_94149
710 2 _aSpringerLink (Online service)
_951084
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783319778716
776 0 8 _iPrinted edition:
_z9783319778730
776 0 8 _iPrinted edition:
_z9783030085612
830 0 _aSpringer Series in Advanced Manufacturing,
_x2196-1735
_951085
856 4 0 _uhttps://doi.org/10.1007/978-3-319-77872-3
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c78706
_d78706