000 03683nam a22005655i 4500
001 978-3-319-70917-8
003 DE-He213
005 20220801221153.0
007 cr nn 008mamaa
008 180216s2018 sz | s |||| 0|eng d
020 _a9783319709178
_9978-3-319-70917-8
024 7 _a10.1007/978-3-319-70917-8
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aLutz, Josef.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_954492
245 1 0 _aSemiconductor Power Devices
_h[electronic resource] :
_bPhysics, Characteristics, Reliability /
_cby Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker.
250 _a2nd ed. 2018.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2018.
300 _aXIX, 714 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aPower Semiconductor Devices – Key Components for Efficient Electrical Energy Conversion Systems -- Semiconductor Properties -- pn-Junctions -- Short Introduction to Power Device Technology -- pin-Diodes -- Schottky Diodes -- Bipolar Transistors -- Thyristors -- MOS Transistors -- IGBTs -- Packaging and Reliability of Power Devices -- Destructive Mechanisms in Power Devices -- Power Device-Induced Oscillations and Electromagnetic Disturbances -- Power Electronic System Integration.
520 _aThis book discusses semiconductor properties, pn-junctions and the physical phenomena for understanding power devices in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. Special peculiarities of devices from the ascending semiconductor materials SiC and GaN are discussed. This book presents significant improvements compared to its first edition. It includes chapters on packaging and reliability. The chapter on semiconductor technology is written in a more in-depth way by considering 2D- and high concentration effects. The chapter on IGBTs is extended by new technologies and evaluation of its potential. An extended theory of cosmic ray failures is presented. The range of certain important physical relationships, doubted in recent papers for use in device simulation, is cleared and substantiated in this second edition.
650 0 _aElectronic circuits.
_919581
650 0 _aElectric power production.
_927574
650 0 _aElectronics.
_93425
650 1 4 _aElectronic Circuits and Systems.
_954493
650 2 4 _aElectrical Power Engineering.
_931821
650 2 4 _aMechanical Power Engineering.
_932122
650 2 4 _aElectronics and Microelectronics, Instrumentation.
_932249
700 1 _aSchlangenotto, Heinrich.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_954494
700 1 _aScheuermann, Uwe.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_954495
700 1 _aDe Doncker, Rik.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_954496
710 2 _aSpringerLink (Online service)
_954497
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783319709161
776 0 8 _iPrinted edition:
_z9783319709185
776 0 8 _iPrinted edition:
_z9783319890111
856 4 0 _uhttps://doi.org/10.1007/978-3-319-70917-8
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c79369
_d79369