000			03492nam a22005295i 4500
001			978-3-319-01174-5
003			DE-He213
005			20220801222009.0
007			cr nn 008mamaa
008			151111s2016 sz | s |||| 0|eng d
020			_a9783319011745 _9978-3-319-01174-5
024	7		_a10.1007/978-3-319-01174-5 _2doi
050		4	_aTK7867-7867.5
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
072		7	_aTJFC _2thema
082	0	4	_a621.3815 _223
100	1		_aParker, Kenneth P. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _959134
245	1	4	_aThe Boundary-Scan Handbook _h[electronic resource] / _cby Kenneth P. Parker.
250			_a4th ed. 2016.
264		1	_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2016.
300			_aXXXIV, 552 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aBoundary-Scan Basics And Vocabulary.-  Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan.-  IEEE 1149.6 Testing Advanced I/O.-  IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision.-  IEEE 1149.6: The 2015 Revision.
520			_aAimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;   Explains the new IEEE 1149.8.1 subsidiary standard and applications;   Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1                      Digital Boundary-Scan IEEE Std 1149.4                      Analog Boundary-Scan IEEE Std 1149.6                      Advanced I/O Testing IEEE Std 1149.8.1                    Passive Component Testing IEEE Std 1149.1-2013                 The 2013 Revision of 1149.1 IEEE Std 1532                        In-System Configuration IEEE Std 1149.6-2015                 The 2015 Revision of 1149.6.
650		0	_aElectronic circuits. _919581
650		0	_aMicroprocessors. _959135
650		0	_aComputer architecture. _93513
650		0	_aSemiconductors. _93077
650	1	4	_aElectronic Circuits and Systems. _959136
650	2	4	_aProcessor Architectures. _959137
650	2	4	_aSemiconductors. _93077
710	2		_aSpringerLink (Online service) _959138
773	0		_tSpringer Nature eBook
776	0	8	_iPrinted edition: _z9783319011738
776	0	8	_iPrinted edition: _z9783319011752
776	0	8	_iPrinted edition: _z9783319330693
856	4	0	_uhttps://doi.org/10.1007/978-3-319-01174-5
912			_aZDB-2-ENG
912			_aZDB-2-SXE
942			_cEBK
999			_c80286 _d80286