000 00399nam a2200133Ia 4500
008 190706s9999 xx 000 0 und d
020 _a0-7923-7991-8
082 _a621.395 B978
100 _aBUSHNELL,M.L
245 0 _aESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCU
260 _aBoston
_bKluwer Academic
_c2000
300 _axxviii+690p.,26x18Cm
942 _cREF
_2DDC
999 _c8046
_d8046