000			06193cam a2200817Mi 4500
001			ocn889252808
003			OCoLC
005			20220908100033.0
006			m o d
007			cr cn|||||||||
008			920312t19921992njua ob 001 0 eng d
040			_aE7B _beng _erda _epn _cE7B _dOCLCO _dJSTOR _dOCLCF _dDEBBG _dN$T _dOCLCQ _dDEBSZ _dYDXCP _dOCLCQ _dIGB _dAGLDB _dEZ9 _dDEGRU _dD6H _dSTF _dOCLCQ _dVTS _dOCLCQ _dLVT _dS9I _dCOO _dDKC _dOCLCQ _dLEAUB _dUX1 _dAJS _dIEEEE _dOCLCO
019			_a956738559 _a1013955510 _a1029825195 _a1032677483 _a1037978592 _a1041976614 _a1046612531 _a1046729852 _a1047005755 _a1079012813 _a1086506215 _a1175625423
020			_a9781400862849 _q(electronic bk.)
020			_a1400862841 _q(electronic bk.)
020			_a9780691087634
020			_a0691087636
020			_a0691603014
020			_a9780691603018
024	7		_a10.1515/9781400862849 _2doi
029	1		_aAU@ _b000056929753
029	1		_aCHBIS _b011057809
029	1		_aCHVBK _b498856453
029	1		_aDEBBG _bBV042523994
029	1		_aDEBSZ _b446794007
029	1		_aGBVCP _b100378416X
035			_a(OCoLC)889252808 _z(OCoLC)956738559 _z(OCoLC)1013955510 _z(OCoLC)1029825195 _z(OCoLC)1032677483 _z(OCoLC)1037978592 _z(OCoLC)1041976614 _z(OCoLC)1046612531 _z(OCoLC)1046729852 _z(OCoLC)1047005755 _z(OCoLC)1079012813 _z(OCoLC)1086506215 _z(OCoLC)1175625423
037			_a22573/ctt738995 _bJSTOR
037			_a9453259 _bIEEE
050		4	_aTK7871.99.M44 _bS525 1992eb
072		7	_aMAT040000 _2bisacsh
072		7	_aTEC _x009070 _2bisacsh
082	0	4	_a621.39/5 _220
049			_aMAIN
100	1		_aShoji, Masakazu, _d1936- _eauthor. _964206
245	1	0	_aTheory of CMOS digital circuits and circuit failures / _cMasakazu Shoji.
264		1	_aPrinceton, New Jersey : _bPrinceton University Press, _c[1992]
264		4	_c�1992
300			_a1 online resource (589 pages) : _billustrations
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_adata file _2rda
490	0		_aPrinceton legacy library
504			_aIncludes bibliographical references and index.
588	0		_aPrint version record.
505	0	0	_tFrontmatter -- _tContents -- _tPreface and Acknowledgments -- _tList of Mathematical Symbols -- _tChapter 1. Physics of CMOS Integrated Circuits -- _tChapter 2. Method of Analysis of CMOS Circuit Failures -- _tChapter 3. Circuit Failures Due to Anomalous Signal Flow -- _tChapter 4. Noise Phenomena in Digital Circuits -- _tChapter 5. Circuit Failures Due to Timing Problems -- _tChapter 6. Essential Uncertainty in CMOS Circuits -- _tChapter 7. Design Failures of CMOS Systems -- _tIndex.
520			_aCMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905.
546			_aIn English.
590			_aIEEE _bIEEE Xplore Princeton University Press eBooks Library
650		0	_aMetal oxide semiconductors, Complementary. _93260
650		0	_aSemiconductors _xFailures. _964207
650		0	_aDigital integrated circuits _xDesign and construction _xData processing. _964208
650		6	_aMOS compl�ementaires. _964209
650		6	_aSemi-conducteurs _xD�efaillances. _964210
650		6	_aCircuits int�egr�es num�eriques _xConception et construction _xInformatique. _964211
650		7	_aMATHEMATICS _xComplex Analysis. _2bisacsh _963863
650		7	_aTECHNOLOGY & ENGINEERING _xMechanical. _2bisacsh _964212
650		7	_aDigital integrated circuits _xDesign and construction _xData processing. _2fast _0(OCoLC)fst00893697 _964208
650		7	_aMetal oxide semiconductors, Complementary. _2fast _0(OCoLC)fst01017635 _93260
650		7	_aSemiconductors _xFailures. _2fast _0(OCoLC)fst01112222 _964207
655		4	_aElectronic books. _93294
776	0	8	_iPrint version: _aShoji, Masakazu. _tTheory of CMOS digital circuits and circuit failures. _dPrinceton, New Jersey : Princeton University Press, [1992] _hxviii, 570 pages ; 27 cm _kPrinceton legacy library _z9780691603018 _w(DLC) 10899030
856	4	0	_uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=9453259
938			_aDe Gruyter _bDEGR _n9781400862849
938			_aebrary _bEBRY _nebr10899030
938			_aEBSCOhost _bEBSC _n790985
938			_aYBP Library Services _bYANK _n11997457
942			_cEBK
994			_a92 _bINTKS
999			_c81265 _d81265