000			02180nam a2200337 i 4500
001			CR9780511615092
003			UkCbUP
005			20230516164909.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			090914s2003||||enk o ||1 0|eng|d
020			_a9780511615092 (ebook)
020			_z9780521620062 (hardback)
020			_z9780521629959 (paperback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aQH212.T7 _bD4 2003
082	0	0	_a620.1/1299 _221
100	1		_aDe Graef, Marc, _eauthor. _967990
245	1	0	_aIntroduction to conventional transmission electron microscopy / _cMarc De Graef.
264		1	_aCambridge : _bCambridge University Press, _c2003.
300			_a1 online resource (xxi, 718 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
520			_aThis 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
650		0	_aTransmission electron microscopy. _967991
776	0	8	_iPrint version: _z9780521620062
856	4	0	_uhttps://doi.org/10.1017/CBO9780511615092
942			_cEBK
999			_c82201 _d82201