| 000 | 02502nam a2200385 i 4500 | ||
|---|---|---|---|
| 001 | CR9781108284578 | ||
| 003 | UkCbUP | ||
| 005 | 20230516164909.0 | ||
| 006 | m|||||o||d|||||||| | ||
| 007 | cr|||||||||||| | ||
| 008 | 170124s2022||||enk o ||1 0|eng|d | ||
| 020 | _a9781108284578 (ebook) | ||
| 020 | _z9781108418096 (hardback) | ||
| 040 |
_aUkCbUP _beng _erda _cUkCbUP |
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| 050 | 0 | 0 |
_aQD506 _b.M66 2022 |
| 082 | 0 | 0 |
_a541/.33 _223/eng/20220126 |
| 100 | 1 |
_aMoritz, Wolfgang, _d1943- _eauthor. _967992 |
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| 245 | 1 | 0 |
_aSurface structure determination by LEED and X-rays / _cWolfgang Moritz, Michel A. Van Hove. |
| 264 | 1 |
_aCambridge ; New York, NY, USA : _bCambridge University Press, _c2022. |
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| 300 |
_a1 online resource (xxxiii, 440 pages) : _bdigital, PDF file(s). |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 500 | _aTitle from publisher's bibliographic system (viewed on 18 Aug 2022). | ||
| 520 | _aThis timely text covers the theory and practice of surface and nanostructure determination by low-energy electron diffraction (LEED) and surface X-ray diffraction (SXRD): it is the first book on such quantitative structure analysis in over 30 years. It provides a detailed description of the theory, including cutting-edge developments and tested experimental methods. The focus is on quantitative techniques, while the qualitative interpretation of the LEED pattern without quantitative I(V) analysis is also included. Topics covered include the future study of nanoparticles, quasicrystals, thermal parameters, disorder and modulations of surfaces with LEED, with introductory sections enabling the non-specialist to follow all the concepts and applications discussed. With numerous colour figures throughout, this text is ideal for undergraduate and graduate students and researchers, whether experimentalists or theorists, in the fields of surface science, nanoscience and related technologies. It can serve as a textbook for graduate-level courses of one or two semesters. | ||
| 650 | 0 |
_aSurface chemistry. _94753 |
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| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. _96442 |
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| 650 | 0 |
_aLow energy electron diffraction. _967993 |
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| 650 | 0 |
_aX-ray diffraction imaging. _967994 |
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| 650 | 0 |
_aChemical structure. _915442 |
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| 700 | 1 |
_aVan Hove, M. A. _q(Michael A.), _d1947- _eauthor. _967995 |
|
| 776 | 0 | 8 |
_iPrint version: _z9781108418096 |
| 856 | 4 | 0 | _uhttps://doi.org/10.1017/9781108284578 |
| 942 | _cEBK | ||
| 999 |
_c82202 _d82202 |
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