000 | 04762cam a2200565 a 4500 | ||
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001 | on1155316088 | ||
003 | OCoLC | ||
005 | 20230516165852.0 | ||
006 | m o d | ||
007 | cr |n||||||||| | ||
008 | 200525s2020 enk o 001 0 eng d | ||
040 |
_aYDX _beng _epn _cYDX _dOPELS _dUKAHL _dN$T _dOCLCF _dUKMGB _dEBLCP _dOCLCQ _dOCLCO _dSFB _dOCLCQ |
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015 |
_aGBC065594 _2bnb |
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016 | 7 |
_a019806793 _2Uk |
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019 | _a1156140815 | ||
020 |
_a9780081028032 _q(electronic bk.) |
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020 |
_a0081028032 _q(electronic bk.) |
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020 | _z9780128172469 | ||
020 | _z0128172460 | ||
035 |
_a(OCoLC)1155316088 _z(OCoLC)1156140815 |
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050 | 4 | _aTA418.5 | |
082 | 0 | 4 |
_a620.1/12 _223 |
100 | 1 |
_aCho, Yasuo. _968739 |
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245 | 1 | 0 |
_aScanning nonlinear dielectric microscopy : _binvestigation of ferroelectric, dielectric, and semiconductor materials and devices / _cYasuo Cho. |
260 |
_aDuxford : _bWoodhead Publishing, _c2020. |
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300 | _a1 online resource | ||
336 |
_atext _btxt _2rdacontent |
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336 |
_astill image _bsti _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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490 | 1 | _aWoodhead Publishing Series in Electronic and Optical Materials | |
500 | _aIncludes index. | ||
505 | 0 | _aFront Cover -- Scanning Nonlinear Dielectric Microscopy -- Copyright Page -- Contents -- Preface -- 1 Principles of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric materials -- 1.1 Basic theory -- 1.1.1 Macroscopic phenomenological definition of linear and nonlinear dielectric constants -- 1.1.2 Capacitance variation with alternating electric field -- 1.2 System setup of scanning nonlinear dielectric microscopy -- 1.3 Theory for nonlinear dielectric imaging -- 1.3.1 General theorem for capacitance variation under applied electric field | |
505 | 8 | _a1.3.2 Theoretical calculation for scanning nonlinear dielectric microscopy image -- 1.4 Higher-order scanning nonlinear dielectric microscopy -- 1.4.1 Theory -- 1.4.2 Theoretical one-dimensional image and depth sensitivity of higher-order scanning nonlinear dielectric microscopy -- References -- 2 Ferroelectric polarization measurement -- 2.1 Analysis of distributions of ferroelectric domains on a microscopic scale using scanning nonlinear dielectric microscopy -- 2.2 Higher-order nonlinear dielectric analyses -- References -- 3 Three-dimensional polarization measurement | |
505 | 8 | _a3.1 Basics of three-dimensional polarization distribution assessment -- 3.2 Principles of three-dimensional polarization assessment using scanning nonlinear dielectric microscopy -- 3.3 Lateral assessment by Kelvin force microscopy with electric field correction -- 3.4 Lateral nanoscale assessment with electric field correction -- References -- 4 Ultrahigh-density ferroelectric data storage using scanning nonlinear dielectric microscopy -- 4.1 Ferroelectric probe memory based on scanning nonlinear dielectric microscopy with a linear scanning stage | |
505 | 8 | _a4.1.1 Scanning nonlinear dielectric microscopy with a linear scanning stage for ultrahigh-density ferroelectric data storage -- 4.1.2 Analysis of nanodomain dots in congruent single-crystal LiTaO3 -- 4.1.3 Manipulating nanodomains using scanning nonlinear dielectric microscopy with a linear scanning stage -- 4.2 Hard-disk-drive-type scanning nonlinear dielectric microscopy ferroelectric probe memory -- 4.2.1 Background on development of ultrahigh-density hard-disk-drive-type scanning nonlinear dielectric microscopy ferroele ... | |
505 | 8 | _a4.2.2 An scanning nonlinear dielectric microscopy ferroelectric data storage system having an hard disk drive format -- 4.2.3 Ferroelectric recording media for scanning nonlinear dielectric microscopy probe memory having an hard disk drive format -- 4.2.4 Rapid R/W characteristics of an scanning nonlinear dielectric microscopy data storage system -- 4.2.5 An hard disk drive scanning nonlinear dielectric microscopy data storage unit for high-density ferroelectric recording | |
650 | 0 |
_aMaterials _xAnalysis. _96593 |
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650 | 0 |
_aMicroscopy. _914697 |
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650 | 2 |
_aMicroscopy _0(DNLM)D008853 _914697 |
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650 | 6 |
_aMat�eriaux _xAnalyse. _0(CaQQLa)201-0297100 _968740 |
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650 | 6 |
_aMicroscopie. _0(CaQQLa)201-0055735 _968741 |
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650 | 7 |
_amicroscopy. _2aat _0(CStmoGRI)aat300054100 _914697 |
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650 | 7 |
_aMaterials _xAnalysis. _2fast _0(OCoLC)fst01011773 _96593 |
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650 | 7 |
_aMicroscopy. _2fast _0(OCoLC)fst01020062 _914697 |
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776 | 0 | 8 |
_iPrint version: _z0128172460 _z9780128172469 _w(OCoLC)1127934545 |
830 | 0 |
_aWoodhead Publishing series in electronic and optical materials. _968742 |
|
856 | 4 | 0 |
_3ScienceDirect _uhttps://www.sciencedirect.com/science/book/9780128172469 |
942 | _cEBK | ||
999 |
_c82441 _d82441 |