| 000 | 03276cam a2200493 i 4500 | ||
|---|---|---|---|
| 001 | on1281904990 | ||
| 003 | OCoLC | ||
| 005 | 20230516165958.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 211102s2021 ne o 000 0 eng d | ||
| 040 |
_aOPELS _beng _erda _epn _cOPELS _dEBLCP _dYDX _dUKMGB _dOCLCF _dUKAHL _dOCLCQ _dOCLCO _dN$T _dOCLCO _dK6U _dOCLCQ |
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_aGBC1F4305 _2bnb |
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| 016 | 7 |
_a020327944 _2Uk |
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| 019 |
_a1280458310 _a1280598333 _a1281131841 |
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| 020 |
_a0128220848 _q(electronic book) |
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| 020 |
_a9780128220849 _q(electronic bk.) |
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| 020 | _z9780128220832 | ||
| 020 | _z012822083X | ||
| 035 |
_a(OCoLC)1281904990 _z(OCoLC)1280458310 _z(OCoLC)1280598333 _z(OCoLC)1281131841 |
||
| 050 | 4 |
_aTK7871.85 _b.S46 2021 |
|
| 082 | 0 | 4 |
_a620.115 _223 |
| 245 | 0 | 0 |
_aSemiconductor nanodevices : _bphysics, technology and applications / _cedited by David A. Ritchie. |
| 264 | 1 |
_aAmsterdam, Netherlands ; _aCambridge, MA : _bElsevier, _c[2021] |
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| 300 | _a1 online resource | ||
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
||
| 490 | 1 |
_aFrontiers of nanoscience ; _vvolume 20 |
|
| 505 | 0 | _a<P>1. Introduction</p> <p><b>Part I: Growth, Fabrication and Characterisation Techniques (including seminal work) </b>2. Semiconductor Growth, MBE, MOCVD 3. Fabrication Techniques Contacts Gates: Wet and Dry Etching; E beam Lithography 4. Microscopy techniques, SEM, TEM, AFM, etc -- Rachel Oliver (Cambridge) 5. Low Temperature Optical Measurements 6. Low Temperature Electrical Measurements 7. Conclusion to Part I</p> <p><b>Part II Recent Research Advances </b>8. Self-assembled Semiconductor Nanowires InAs, Growth Techniques and Applications to Electrical and Optical Devices 9. Quantum Dots -- Single and Entangled Photon Emitters 10. Quantum Dot Lasers 11. Quantum dot solar cells -- Yoshi Okada (U Tokyo) 12. Solution Processed Quantum Dots 13. Electrostatically Defined Structures 1: Quantum Point Contacts 14. Electrostatically Defined Structures 2: Quantum Dots, Thermal Effects 15. Noise Measurements in Semiconductor Nanostructures 16. Single Electron Pumps 17. Single Atom Devices 18. Strong Spin-orbit Interaction Devices 19. Silicon Microelectronics: State of the Art 20. Silicon quantum computing devices 21. Polariton Quantum Fluids in Patterned Microcavities 22. 2D Materials 23. Topological Insulators 24. Conclusion to Part II</p> | |
| 650 | 0 |
_aSemiconductors. _93077 |
|
| 650 | 0 |
_aNanostructured materials. _94537 |
|
| 650 | 2 |
_aSemiconductors _0(DNLM)D012666 _93077 |
|
| 650 | 2 |
_aNanostructures _0(DNLM)D049329 _95928 |
|
| 650 | 6 |
_aSemi-conducteurs. _0(CaQQLa)201-0318258 _969266 |
|
| 650 | 6 |
_aNanomat�eriaux. _0(CaQQLa)201-0258061 _968453 |
|
| 650 | 7 |
_asemiconductor. _2aat _0(CStmoGRI)aat300015117 _969269 |
|
| 650 | 7 |
_aNanostructured materials. _2fast _0(OCoLC)fst01032630 _94537 |
|
| 650 | 7 |
_aSemiconductors. _2fast _0(OCoLC)fst01112198 _93077 |
|
| 776 | 0 | 8 |
_iPrint version: _tSEMICONDUCTOR NANODEVICES. _d[Place of publication not identified] : ELSEVIER, 2021 _z012822083X _w(OCoLC)1231957385 |
| 830 | 0 |
_aFrontiers of nanoscience ; _vv. 20. _969629 |
|
| 856 | 4 | 0 |
_3ScienceDirect _uhttps://www.sciencedirect.com/science/bookseries/18762778/21 |
| 942 | _cEBK | ||
| 999 |
_c82648 _d82648 |
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