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020 _a9780750330275
_qebook
020 _a9780750330268
_qmobi
020 _z9780750330251
_qprint
020 _z9780750330282
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024 7 _a10.1088/978-0-7503-3027-5
_2doi
035 _a(CaBNVSL)thg00083525
035 _a(OCoLC)1358413911
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aQC367
_b.M464 2022eb
072 7 _aPHJ
_2bicssc
072 7 _aSCI053000
_2bisacsh
082 0 4 _a681/.25
_223
100 1 _aMendoza-Santoyo Fernando,
_eauthor.
_970780
245 1 0 _aFull field optical metrology and applications /
_cFernando Mendoza-Santoyo, Manuel De la Torre-Ibarra, Mar�ia del Socorro Hern�andez-Montes and Jorge Mauricio Flores Moreno.
264 1 _aBristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :
_bIOP Publishing,
_c[2022]
300 _a1 online resource (various pagings) :
_billustrations (some color).
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
490 1 _a[IOP release $release]
490 1 _aIOP series in advances in optics, photonics and optoelectronics
490 1 _aIOP ebooks. [2022 collection]
500 _a"Version: 20221201"--Title page verso.
504 _aIncludes bibliographical references.
505 0 _a1. Foundations of optical interferometry -- 1.1. Light waves -- 1.2. Types of interferometers -- 1.3. Interference of light waves -- 1.4. Multiple wave interference -- 1.5. White-light interferometry -- 1.6. Holographic interferometry
505 8 _a2. Coherence -- 2.1. Introduction : the background -- 2.2. Basic principles of coherence -- 2.3. Temporal coherence -- 2.4. Partial coherence -- 2.5. Spatial coherence
505 8 _a3. Phase retrieval -- 3.1. Phase sampling evaluation -- 3.2. Modern methods for phase retrieval -- 3.3. Interference phase demodulation
505 8 _a4. Laser speckle metrology -- 4.1. Basics for laser speckle metrology -- 4.2. Laser speckle measurements
505 8 _a5. Moir�e interferometry -- 5.1. Introduction -- 5.2. Moir�e pattern formulation -- 5.3. Moir�e pattern alignment -- 5.4. Shape detection via the moir�e pattern
505 8 _a6. Holography -- 6.1. Digital holographic interferometry
505 8 _a7. Digital speckle pattern interferometry (DSPI) -- 7.1. Background -- 7.2. DSPI technique -- 7.3. The sensitivity vector, the displacement vector, and the optical phase difference -- 7.4. In-plane and out-of-plane sensitive set-ups -- 7.5. Phase-stepping interferometry -- 7.6. Vibration modes obtained with DSPI
505 8 _a8. 3D digital holographic interferometry -- 8.1. Principle -- 8.2. Illuminating once at a time -- 8.3. Illuminating at the same time (simultaneously) -- 8.4. Strain measurement using DHI -- 8.5. Deformation in 3D measurements -- 8.6. Amplitude and phase calculation for harmonic excitation with pulsed object illumination : an example
505 8 _a9. Digital holographic microscopy for surface profilometry -- 9.1. Introduction -- 9.2. Digital holographic microscopy -- 9.3. Optical phase unwrapping by multi-wavelength digital holographic microscopy -- 9.4. Digital holography using low coherence sources
505 8 _a10. Contouring -- 10.1. Two points of object illumination -- 10.2. Two-wavelength contouring -- 10.3. Contouring from experimental data
505 8 _a11. Optical coherence tomography -- 11.1. OCT configurations -- 11.2. Optical phase in spectral OCT -- 11.3. Examples of depth-resolved phase measurement
505 8 _a12. Digital image correlation -- 12.1. A brief introduction to digital image correlation -- 12.2. Two-dimensional digital image correlation -- 12.3. Three-dimensional digital image correlation
505 8 _a13. Speckle-noise reduction in optical techniques by non-local means methods -- 13.1. Introduction -- 13.2. Non-local means methods -- 13.3. Examples
505 8 _a14. Overview of recent applications using DHI -- 14.1. Introduction -- 14.2. Basic applications of DHI
505 8 _a15. A couple of trending applications related to holography -- 15.1. Electron holographic interferometry -- 15.2. Quantum holography.
520 3 _aThis book introduces non-contact optical techniques based on the speckle effect in more detail.
521 _aScientists and Engineers looking for a reference book giving detailed work on methods/techniques in full field speckle-based metrology.
530 _aAlso available in print.
538 _aMode of access: World Wide Web.
538 _aSystem requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
545 _aFernando Mendoza Santoyo is an Emeritus Professor at Centro de Investigaciones en Optica-CIO, M�exico, where he was the founder of the Optical Metrology Division in 1991.
588 0 _aTitle from PDF title page (viewed on January 9, 2023).
650 0 _aOptical measurements.
_913953
650 0 _aMetrology.
_96667
650 7 _aOptical physics.
_2bicssc
_970781
650 7 _aSCIENCE / Physics / Optics & Light.
_2bisacsh
_915843
700 1 _aTorre-Ibarra, Manuel de la,
_eauthor.
_970782
700 1 _aHern�andez-Montes, Mar�ia del Socorro,
_eauthor.
_970783
700 1 _aFlores Moreno, Jorge Mauricio,
_eauthor.
_970784
710 2 _aInstitute of Physics (Great Britain),
_epublisher.
_911622
776 0 8 _iPrint version:
_z9780750330251
_z9780750330282
830 0 _aIOP (Series).
_pRelease 22.
_970785
830 0 _aIOP series in advances in optics, photonics and optoelectronics.
_970786
830 0 _aIOP ebooks.
_p2022 collection.
_970787
856 4 0 _uhttps://iopscience.iop.org/book/edit/978-0-7503-3027-5
942 _cEBK
999 _c82904
_d82904