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001 9780750332354
003 IOP
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006 m eo d
007 cr cn |||m|||a
008 221205s2022 enka fob 000 0 eng d
020 _a9780750332354
_qebook
020 _a9780750332347
_qmobi
020 _z9780750332330
_qprint
020 _z9780750332361
_qmyPrint
024 7 _a10.1088/978-0-7503-3235-4
_2doi
035 _a(CaBNVSL)thg00083501
035 _a(OCoLC)1353822961
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7871.99.M44
_bS743 2022eb
072 7 _aTBM
_2bicssc
072 7 _aTEC064000
_2bisacsh
082 0 4 _a621.36/7
_223
100 1 _aStefanov, Konstantin D.,
_eauthor.
_970849
245 1 0 _aCMOS image sensors /
_cKonstantin D. Stefanov.
264 1 _aBristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :
_bIOP Publishing,
_c[2022]
300 _a1 online resource (various pagings) :
_billustrations (some color).
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
490 1 _a[IOP release $release]
490 1 _aIOP ebooks. [2022 collection]
500 _a"Version: 20221201"--Title page verso.
504 _aIncludes bibliographical references.
505 0 _a1. The fundamentals -- 1.1. Introduction--what is an image sensor and what does it do? -- 1.2. Charge generation -- 1.3. Charge collection -- 1.4. Charge transfer -- 1.5. Charge conversion -- 1.6. pn junction -- 1.7. MOS capacitor -- 1.8. MOS transistor -- 1.9. Source follower
505 8 _a2. CMOS pixel architectures -- 2.1. History and technology -- 2.2. Photodiode APS -- 2.3. Pinned photodiode (4T) -- 2.4. Other PPD-based pixels -- 2.5. Hybrid and 3D image sensors
505 8 _a3. Advanced image sensor topics -- 3.1. Photocurrent -- 3.2. Dark current -- 3.3. Reflective barrier -- 3.4. Back-side illumination -- 3.5. Depletion depth and potential gradients -- 3.6. Punch-through -- 3.7. Field-induced junctions
505 8 _a4. Noise and readout techniques -- 4.1. Noise in image sensors -- 4.2. Correlated double sampling
505 8 _a5. Characterisation -- 5.1. Introduction -- 5.2. Readout modes -- 5.3. Principles of EO characterisation -- 5.4. Photoresponse, non-uniformity and nonlinearity -- 5.5. Photon transfer curve -- 5.6. X-ray calibration -- 5.7. Full well capacity and dynamic range -- 5.8. Dark current and DSNU -- 5.9. Noise measurement -- 5.10. Image lag -- 5.11. Quantum efficiency -- 5.12. Electrical transfer function
505 8 _a6. Electronics -- 6.1. On-chip electronics -- 6.2. Off-chip electronics.
520 3 _aThis book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques.
521 _aPhysicists and engineers in image sensor characterisation, development and research.
530 _aAlso available in print.
538 _aMode of access: World Wide Web.
538 _aSystem requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
545 _aDr. Konstantin Stefanov is a Senior Research Fellow at the Centre for Electronic Imaging at The Open University, UK, and has over 20 years of experience in the field of CMOS and CCD image sensors, including characterisation, simulations, and design.
588 0 _aTitle from PDF title page (viewed on December 5, 2022).
650 0 _aMetal oxide semiconductors, Complementary.
_93260
650 0 _aImage processing
_xDigital techniques.
_94145
650 7 _aInstruments & instrumentation engineering.
_2bicssc
_970395
650 7 _aTECHNOLOGY & ENGINEERING / Sensors.
_2bisacsh
_914223
710 2 _aInstitute of Physics (Great Britain),
_epublisher.
_911622
776 0 8 _iPrint version:
_z9780750332330
_z9780750332361
830 0 _aIOP (Series).
_pRelease 22.
_970850
830 0 _aIOP ebooks.
_p2022 collection.
_970851
856 4 0 _uhttps://iopscience.iop.org/book/mono/978-0-7503-3235-4
942 _cEBK
999 _c82916
_d82916