000 | 04082nam a2200661 i 4500 | ||
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001 | 9780750332354 | ||
003 | IOP | ||
005 | 20230516170314.0 | ||
006 | m eo d | ||
007 | cr cn |||m|||a | ||
008 | 221205s2022 enka fob 000 0 eng d | ||
020 |
_a9780750332354 _qebook |
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020 |
_a9780750332347 _qmobi |
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020 |
_z9780750332330 _qprint |
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020 |
_z9780750332361 _qmyPrint |
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024 | 7 |
_a10.1088/978-0-7503-3235-4 _2doi |
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035 | _a(CaBNVSL)thg00083501 | ||
035 | _a(OCoLC)1353822961 | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
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050 | 4 |
_aTK7871.99.M44 _bS743 2022eb |
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072 | 7 |
_aTBM _2bicssc |
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072 | 7 |
_aTEC064000 _2bisacsh |
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082 | 0 | 4 |
_a621.36/7 _223 |
100 | 1 |
_aStefanov, Konstantin D., _eauthor. _970849 |
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245 | 1 | 0 |
_aCMOS image sensors / _cKonstantin D. Stefanov. |
264 | 1 |
_aBristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : _bIOP Publishing, _c[2022] |
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300 |
_a1 online resource (various pagings) : _billustrations (some color). |
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336 |
_atext _2rdacontent |
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337 |
_aelectronic _2isbdmedia |
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338 |
_aonline resource _2rdacarrier |
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490 | 1 | _a[IOP release $release] | |
490 | 1 | _aIOP ebooks. [2022 collection] | |
500 | _a"Version: 20221201"--Title page verso. | ||
504 | _aIncludes bibliographical references. | ||
505 | 0 | _a1. The fundamentals -- 1.1. Introduction--what is an image sensor and what does it do? -- 1.2. Charge generation -- 1.3. Charge collection -- 1.4. Charge transfer -- 1.5. Charge conversion -- 1.6. pn junction -- 1.7. MOS capacitor -- 1.8. MOS transistor -- 1.9. Source follower | |
505 | 8 | _a2. CMOS pixel architectures -- 2.1. History and technology -- 2.2. Photodiode APS -- 2.3. Pinned photodiode (4T) -- 2.4. Other PPD-based pixels -- 2.5. Hybrid and 3D image sensors | |
505 | 8 | _a3. Advanced image sensor topics -- 3.1. Photocurrent -- 3.2. Dark current -- 3.3. Reflective barrier -- 3.4. Back-side illumination -- 3.5. Depletion depth and potential gradients -- 3.6. Punch-through -- 3.7. Field-induced junctions | |
505 | 8 | _a4. Noise and readout techniques -- 4.1. Noise in image sensors -- 4.2. Correlated double sampling | |
505 | 8 | _a5. Characterisation -- 5.1. Introduction -- 5.2. Readout modes -- 5.3. Principles of EO characterisation -- 5.4. Photoresponse, non-uniformity and nonlinearity -- 5.5. Photon transfer curve -- 5.6. X-ray calibration -- 5.7. Full well capacity and dynamic range -- 5.8. Dark current and DSNU -- 5.9. Noise measurement -- 5.10. Image lag -- 5.11. Quantum efficiency -- 5.12. Electrical transfer function | |
505 | 8 | _a6. Electronics -- 6.1. On-chip electronics -- 6.2. Off-chip electronics. | |
520 | 3 | _aThis book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques. | |
521 | _aPhysicists and engineers in image sensor characterisation, development and research. | ||
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web. | ||
538 | _aSystem requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader. | ||
545 | _aDr. Konstantin Stefanov is a Senior Research Fellow at the Centre for Electronic Imaging at The Open University, UK, and has over 20 years of experience in the field of CMOS and CCD image sensors, including characterisation, simulations, and design. | ||
588 | 0 | _aTitle from PDF title page (viewed on December 5, 2022). | |
650 | 0 |
_aMetal oxide semiconductors, Complementary. _93260 |
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650 | 0 |
_aImage processing _xDigital techniques. _94145 |
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650 | 7 |
_aInstruments & instrumentation engineering. _2bicssc _970395 |
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650 | 7 |
_aTECHNOLOGY & ENGINEERING / Sensors. _2bisacsh _914223 |
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710 | 2 |
_aInstitute of Physics (Great Britain), _epublisher. _911622 |
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776 | 0 | 8 |
_iPrint version: _z9780750332330 _z9780750332361 |
830 | 0 |
_aIOP (Series). _pRelease 22. _970850 |
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830 | 0 |
_aIOP ebooks. _p2022 collection. _970851 |
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856 | 4 | 0 | _uhttps://iopscience.iop.org/book/mono/978-0-7503-3235-4 |
942 | _cEBK | ||
999 |
_c82916 _d82916 |