000 03810nam a2200661 i 4500
001 9780750338356
003 IOP
005 20230516170326.0
006 m eo d
007 cr cn |||m|||a
008 220501s2022 enka fob 000 0 eng d
020 _a9780750338356
_qebook
020 _a9780750338349
_qmobi
020 _z9780750338332
_qprint
020 _z9780750338363
_qmyPrint
024 7 _a10.1088/978-0-7503-3835-6
_2doi
035 _a(CaBNVSL)thg00083258
035 _a(OCoLC)1311975106
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTA1700
_b.K355 2022eb
072 7 _aPHJ
_2bicssc
072 7 _aSCI053000
_2bisacsh
082 0 4 _a535.15
_223
100 1 _aKallepalli, Akhil,
_eauthor.
_971004
245 1 0 _aLaser beam profiling :
_bcost-effective solutions /
_cAkhil Kallepalli, David B. James.
264 1 _aBristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :
_bIOP Publishing,
_c[2022]
300 _a1 online resource (various pagings) :
_billustrations (some color).
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
490 1 _a[IOP release $release]
490 1 _aIOP ebooks. [2022 collection]
500 _a"Version: 20220401"--Title page verso.
504 _aIncludes bibliographical references.
505 0 _a1. Introduction -- 1.1. Light -- 1.2. Detectors -- 1.3. Benefits of using an imaging system
505 8 _a2. Lasers -- 2.1. Light emission, absorption and matter interactions -- 2.2. Properties of lasers and laser light -- 2.3. Laser safety -- 2.4. Additional resources
505 8 _a3. Silicon-based imaging systems -- 3.1. Vision -- 3.2. Detectors -- 3.3. Charge-coupled devices (CCD) detectors -- 3.4. Complementary metal-oxide-semiconductor (CMOS) detectors -- 3.5. Detector characteristics -- 3.6. Additional resources
505 8 _a4. Experimental techniques -- 4.1. Experimental workflow
505 8 _a5. Potential sources of error -- 5.1. Equipment alignment -- 5.2. Sensor saturation -- 5.3. Neutral density filters -- 5.4. Dead pixels -- 5.5. Laser stability -- 5.6. Stray light and background correction -- 6. Conclusions and final remarks.
520 3 _aThis book provides an overview of lasers, silicon sensors, and practical solutions to beam profiling which has never been presented in a single text. Understanding laser beam characteristics before and after interaction with an object provides intrinsic insights into the nature of the object.
521 _aInterdisciplinary students, researchers, and scientists experimenting using laser systems. Optics students with a need visualise the translation of lasers and sensors from a theoretical to a practical perspective.
530 _aAlso available in print.
538 _aMode of access: World Wide Web.
538 _aSystem requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
545 _aDr. Akhil Kallepalli is a Research Associate in the Optics Group, School of Physics and Astronomy at the University of Glasgow. Dr. David B. James is a Senior Lecturer and Head of the Centre for Electronic Warfare, Information and Cyber.
588 0 _aTitle from PDF title page (viewed on May 8, 2022).
650 0 _aSemiconductor lasers.
_971005
650 0 _aOptical detectors.
_971006
650 7 _aOptical physics.
_2bicssc
_971007
650 7 _aOptics and photonics.
_2bisacsh
_918815
700 1 _aJames, David B.
_c(Ph. D.),
_eauthor.
_971008
710 2 _aInstitute of Physics (Great Britain),
_epublisher.
_911622
776 0 8 _iPrint version:
_z9780750338332
830 0 _aIOP (Series).
_pRelease 22.
_971009
830 0 _aIOP ebooks.
_p2022 collection.
_971010
856 4 0 _uhttps://iopscience.iop.org/book/978-0-7503-3835-6
942 _cEBK
999 _c82940
_d82940