000			02389nam a2200361 i 4500
001			CR9781139343466
003			UkCbUP
005			20240730160800.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			120313s2013||||enk o ||1 0|eng|d
020			_a9781139343466 (ebook)
020			_z9781107030411 (hardback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aTK7871.99.M44 _bF67 2013
082	0	0	_a621.3815/284 _223
100	1		_aFossum, Jerry G., _d1943- _eauthor. _974700
245	1	0	_aFundamentals of ultra-thin-body MOSFETs and FinFETs / _cJerry G. Fossum, University of Florida, Gainesville, Vishal P. Trivedi, Freescale Semiconductor, Arizona.
246	3		_aFundamentals of ultra-thin-body MOSFETs & FinFETs
264		1	_aCambridge : _bCambridge University Press, _c2013.
300			_a1 online resource (xvi, 210 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
505	8		_aMachine generated contents note: Preface; List of physical constants; List of symbols; 1. Introduction; 2. Unique features of UTB MOSFETs; 3. Planar fully depleted SOI MOSFETs; 4. FinFETs; Appendix: UFDG; References; Index.
520			_aUnderstand the theory, design and applications of the two principal candidates for the next mainstream semiconductor-industry device with this concise and clear guide to FD/UTB transistors. • Describes FD/SOI MOSFETs and 3-D FinFETs in detail • Covers short-channel effects, quantum-mechanical effects, applications of UTB devices to floating-body DRAM and conventional SRAM • Provides design criteria for nanoscale FinFET and nanoscale thin- and thick-BOX planar FD/SOI MOSFET to help reduce technology development time • Projects potential nanoscale UTB CMOS performances • Contains end-of-chapter exercises. For professional engineers in the CMOS IC field who need to know about optimal non-classical device design and integration, this is a must-have resource.
650		0	_aMetal oxide semiconductor field-effect transistors. _915501
650		0	_aIntegrated circuits _xVery large scale integration. _94044
776	0	8	_iPrint version: _z9781107030411
856	4	0	_uhttps://doi.org/10.1017/CBO9781139343466
942			_cEBK
999			_c84215 _d84215