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019 _a(OCoLC)949614513
020 _a9781501501531
024 7 _a10.1515/9781501501531
_2doi
035 _a(DE-B1597)445032
035 _a(OCoLC)948780477
040 _aDE-B1597
_beng
_cDE-B1597
_erda
041 0 _aeng
044 _agw
_cDE
072 7 _aTEC008090
_2bisacsh
245 0 0 _aNano Devices and Sensors /
_ced. by Juin J. Liou, Shien-Kuei Liaw, Yung-Hui Chung.
264 1 _aBerlin ;
_aBoston :
_bDe Gruyter,
_c[2016]
264 4 _c©2016
300 _a1 online resource (VIII, 220 p.)
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 0 _tFrontmatter --
_tEditorial/Foreword --
_tContents --
_tSubthreshold Behaviors of Nanoscale Silicon and Germanium Junctionless Cylindrical Surrounding-Gate MOSFETs --
_tSilicon-on-Insulator for Spintronic Applications: Spin Lifetime and Electric Spin Manipulation --
_tMultilevel Cell Storage and Resistance Variability in Resistive Random Access Memory --
_tResistive Switching Characteristics and Mechanisms in Silicon Oxide Memory Devices --
_tA Synaptic Device Built in One Diode-One Resistor (1D-1R) Architecture with Intrinsic SiOx-Based Resistive Switching Memory --
_tOn-chip Wide Range Bidirectional Current Sensor for Li-ion Battery Management System --
_tA 12-bit 1-MS/s 26-μW SAR ADC for Sensor Applications --
_tA 5.2/5.8 GHz Dual Band On-Off Keying Transmitter Design for Bio-Signal Transmission --
_tImpacts of ESD Reliability by Different Layout Engineering in the 0.25-μm 60-V High-Voltage LDMOS Devices --
_tImpact-Based Area Allocation for Yield Optimization in Integrated Circuits --
_tEditors --
_tList of authors
506 0 _arestricted access
_uhttp://purl.org/coar/access_right/c_16ec
_fonline access with authorization
_2star
520 _aThe chapters in this edited book are written by some authors who have presented very high quality papers at the 2015 International Symposium of Next-Generation Electronics (ISNE 2015) held in Taipei, Taiwan. The ISNE 2015 was intended to provide a common forum for researchers, scientists, engineers, and practitioners throughout the world to present their latest research findings, ideas, developments, and applications in the general areas of electron devices, integrated circuits, and microelectronic systems and technologies. The scope of the conference includes the following topics: A. Green ElectronicsB. Microelectronic Circuits and SystemsC. Integrated Circuits and Packaging TechnologiesD. Computer and Communication Engineering E. Electron Devices F. Optoelectronic and Semiconductor Technologies The technical program consisted of 4 plenary talks, 23 invited talks, and more than 250 contributed oral and poster presentations. Plenary speakers were recognized experts in their fields, and their talks focused on leading-edge technologies including: "The Future Lithographic Technology for Semiconductor Fabrication" by Dr. Alek C. Chen, Asia ASML, Taiwan. "Detection of Single Traps and Characterization of Individual Traps: Beginning of Atomistic Reliability Physics" by Prof. Toshiaki Tsuchiya, Shimane University, Japan. "The Art and Science of Packaging High-Coupling Photonics Devices and Modules", by Prof. Wood-Hi Cheng, National Chung-Hsing University, Taiwan. "Prospect and Outlook of Electrostatic Discharge (ESD) Protection in Emerging Technologies", by Prof. Juin J. Liou, University of Central Florida, USA. After a rigorous review process, the ISNE 2015 technical program committee has selected 10 outstanding presentations and invited the authors to prepare extended chapters for inclusion in this edited book. Of the 10 chapters, five are focused on the subject of electronic devices, and the other covers the circuit designs for various applications. The authors are working at the academia in Austria, United States, Korea, and Taiwan. The guest editors would like to take this opportunity to express our sincere gratitude to all the members of the ISNE 2015 technical program committees for reviewing the papers and selecting the manuscripts for the edited book. We also thank all the authors for their valuable and excellent contributions to the book.
538 _aMode of access: Internet via World Wide Web.
546 _aIn English.
588 0 _aDescription based on online resource; title from PDF title page (publisher's Web site, viewed 30. Aug 2021)
650 7 _aTechnology & Engineering / Electronics / Semiconductors.
_2bisacsh
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700 1 _aAbraham, Billion,
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700 1 _aAbraham, Billion.
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700 1 _aChang, Kuan-Chang,
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700 1 _aChang, Kuan-Chang.
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700 1 _aChang, Ting-Chang.
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700 1 _aChang, Yao-Feng.
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700 1 _aChen, Poki.
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700 1 _aChen, Shen-Li.
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700 1 _aChen, Yen-Ting.
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700 1 _aChen, Ying-Chen.
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700 1 _aChung, Yung-Hui,
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700 1 _aFowler, Burt,
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700 1 _aFowler, Burt.
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700 1 _aHuang, Shun-Zhao,
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700 1 _aHuang, Shun-Zhao.
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700 1 _aHuang, Yu-Ting,
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700 1 _aHuang, Yu-Ting.
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700 1 _aHwang, Hyunsang.
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700 1 _aJiang, Chunsheng,
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700 1 _aJiang, Chunsheng.
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700 1 _aLee, Tzung-Je,
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700 1 _aLee, Tzung-Je.
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700 1 _aLiang, Renrong,
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700 1 _aLiang, Renrong.
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700 1 _aLiaw, Shien-Kuei ,
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700 1 _aLin, Chun-Ju,
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700 1 _aLin, Chun-Ju.
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700 1 _aOsintsev, Dmitri,
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700 1 _aOsintsev, Dmitry.
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700 1 _aPrakash, Amit,
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700 1 _aPrakash, Amit.
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700 1 _aSelberherr, Siegfried .
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700 1 _aSverdlov, Viktor,
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700 1 _aSverdlov, Viktor.
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700 1 _aSze, Simon M.
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700 1 _aSze, Simon M.,
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700 1 _aTsai, Cheng-Hsun,
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700 1 _aTsai, Cheng-Hsun.
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700 1 _aTsai, Tsung-Ming,
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700 1 _aTsai, Tsung-Ming.
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700 1 _aWang, Jing,
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700 1 _aWang, Jing.
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700 1 _aWang, Yanzhen,
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700 1 _aWang, Yanzhen.
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700 1 _aWidodo, Arif,
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700 1 _aWidodo, Arif.
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700 1 _aWu, Chang-Hsi,
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700 1 _aWu, Chang-Hsi.
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700 1 _aWu, Xiaohan,
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700 1 _aWu, Xiaohan.
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700 1 _aXu, Jun,
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700 1 _aXu, Jun.
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700 1 _aXue, Fei,
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700 1 _aXue, Fei.
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700 1 _aYen, Chia-Wei,
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700 1 _aYen, Chia-Wei.
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700 1 _aYou, Hong-Cheng,
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700 1 _aYou, Hong-Cheng.
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700 1 _aZhou, Fei,
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700 1 _aZhou, Fei.
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773 0 8 _iTitle is part of eBook package:
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_tDG Plus eBook-Package 2016
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_tEBOOK PACKAGE Engineering, Computer Sciences 2016
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