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001 9783110542363
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010 _a2021943619
020 _a9783110542363
024 7 _a10.1515/9783110542363
_2doi
035 _a(DE-B1597)480654
035 _a(OCoLC)1286807918
040 _aDE-B1597
_beng
_cDE-B1597
_erda
041 0 _aeng
044 _agw
_cDE
050 4 _aQC367
_b.G36 2022
072 7 _aTEC004000
_2bisacsh
082 0 4 _a681.25
_223
084 _aZQ 3910
_qSEPA
_2rvk
_0(DE-625)rvk/158088:
100 1 _aGao, Wei,
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_977403
245 1 0 _aOptical Metrology for Precision Engineering /
_cWei Gao, Yuki Shimizu.
264 1 _aBerlin ;
_aBoston :
_bDe Gruyter,
_c[2021]
264 4 _c©2022
300 _a1 online resource (XI, 644 p.)
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 0 _tFrontmatter --
_tPreface --
_tContents --
_tChapter 1 Laser autocollimator --
_tChapter 2 Three-axis angle sensor --
_tChapter 3 Surface encoder --
_tChapter 4 Mosaic encoder --
_tChapter 5 In-line and on-machine surface profiler --
_tChapter 6 Fabrication and calibration of scale grating --
_tChapter 7 Ultrashort-pulse angle sensor --
_tChapter 8 Optical frequency comb --
_tChapter 9 Angle comb --
_tChapter 10 Chromatic confocal comb --
_tChapter 11 Position comb --
_tChapter 12 Optical comb applied metrology --
_tIndex
506 0 _arestricted access
_uhttp://purl.org/coar/access_right/c_16ec
_fonline access with authorization
_2star
520 _aThis book provides readers the fundamentals of optical metrology for precision engineering. The next-generation measurement technologies based on ultrashort pulse laser and optical frequency comb are also presented, making it an essential reference book for various engineering fields.• Introduces fundamental theories and techniques• Combines theories with practical applications• Presents technologies in an easy-to-understand way
530 _aIssued also in print.
538 _aMode of access: Internet via World Wide Web.
546 _aIn English.
588 0 _aDescription based on online resource; title from PDF title page (publisher's Web site, viewed 01. Dez 2022)
650 0 _aMetrology.
_96667
650 0 _aOptical measurements.
_913953
650 7 _aTechnology & Engineering / Automation.
_2bisacsh
_975266
700 1 _aShimizu, Yuki,
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_977404
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tDG Plus DeG Package 2022 Part 1
_z9783110766820
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE COMPLETE 2021 English
_z9783110754001
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE COMPLETE 2021
_z9783110753776
_oZDB-23-DGG
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE Engineering, Computer Sciences 2021 English
_z9783110754070
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE Engineering, Computer Sciences 2021
_z9783110753837
_oZDB-23-DEI
776 0 _cEPUB
_z9783110541274
776 0 _cprint
_z9783110541090
856 4 0 _uhttps://doi.org/10.1515/9783110542363
856 4 0 _uhttps://www.degruyter.com/isbn/9783110542363
856 4 2 _3Cover
_uhttps://www.degruyter.com/document/cover/isbn/9783110542363/original
912 _a978-3-11-075400-1 EBOOK PACKAGE COMPLETE 2021 English
_b2021
912 _a978-3-11-075407-0 EBOOK PACKAGE Engineering, Computer Sciences 2021 English
_b2021
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