000 09538nam a22011295i 4500
001 9783110729122
003 DE-B1597
005 20240730161643.0
006 m|||||o||d||||||||
007 cr || ||||||||
008 230502t20222022gw fo d z eng d
010 _a2021950261
020 _a9783110729122
024 7 _a10.1515/9783110729122
_2doi
035 _a(DE-B1597)572731
035 _a(OCoLC)1306056412
040 _aDE-B1597
_beng
_cDE-B1597
_erda
041 0 _aeng
044 _agw
_cDE
072 7 _aTEC004000
_2bisacsh
245 0 0 _aOutliers in Control Engineering :
_bFractional Calculus Perspective /
_ced. by Paweł D. Domański, YangQuan Chen, Maciej Ławryńczuk.
264 1 _aBerlin ;
_aBoston :
_bDe Gruyter,
_c[2022]
264 4 _c©2022
300 _a1 online resource (X, 262 p.)
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 0 _aFractional Calculus in Applied Sciences and Engineering ,
_x2509-7210 ;
_v10
505 0 0 _tFrontmatter --
_tPreface --
_tContents --
_tPart I: Foundations --
_t1 Outliers in control engineering-they exist, like it or not --
_tPart II: Theory --
_t2 On the possibilities of using fractional-order differential calculus in linear and nonlinear model predictive control --
_t3 Stochastic control systems with long-range dependent noise --
_t4 Outlier-robust Kalman filtering framework based on statistical similarity measure --
_t5 Multifractal characteristics of singular signals --
_tPart III: Practice --
_t6 Study on robustness of nonlinear model predictive control performance assessment --
_t7 Causality analysis incorporating outliers information --
_t8 Backlash quantification in control systems using noises with outliers: a benchmark study --
_t9 Control performance assessment of the system with fractional-order dynamics --
_t10 A novel method for control performance assessment with fractional-order signal processing --
_t11 Study on oscillation detection robustness and outlier filtering impact --
_t12 3D outliers in BIM supported electrical cable tracing --
_t13 A radio frequency impedance matching control benchmark and optimal fractional-order stochastic extremum seeking method --
_tIndex
506 0 _arestricted access
_uhttp://purl.org/coar/access_right/c_16ec
_fonline access with authorization
_2star
520 _aOutliers play an important, though underestimated, role in control engineering. Traditionally they are unseen and neglected. In opposition, industrial practice gives frequent examples of their existence and their mostly negative impacts on the control quality. The origin of outliers is never fully known. Some of them are generated externally to the process (exogenous), like for instance erroneous observations, data corrupted by control systems or the effect of human intervention. Such outliers appear occasionally with some unknow probability shifting real value often to some strange and nonsense value. They are frequently called deviants, anomalies or contaminants. In most cases we are interested in their detection and removal. However, there exists the second kind of outliers. Quite often strange looking data observations are not artificial data occurrences. They may be just representatives of the underlying generation mechanism being inseparable internal part of the process (endogenous outliers). In such a case they are not wrong and should be treated with cautiousness, as they may include important information about the dynamic nature of the process. As such they cannot be neglected nor simply removed. The Outlier should be detected, labelled and suitably treated. These activities cannot be performed without proper analytical tools and modeling approaches. There are dozens of methods proposed by scientists, starting from Gaussian-based statistical scoring up to data mining artificial intelligence tools. The research presented in this book presents novel approach incorporating non-Gaussian statistical tools and fractional calculus approach revealing new data analytics applied to this important and challenging task. The proposed book includes a collection of contributions addressing different yet cohesive subjects, like dynamic modelling, classical control, advanced control, fractional calculus, statistical analytics focused on an ultimate goal: robust and outlier-proof analysis. All studied problems show that outliers play an important role and classical methods, in which outlier are not taken into account, do not give good results. Applications from different engineering areas are considered such as semiconductor process control and monitoring, MIMO peltier temperature control and health monitoring, networked control systems, and etc.
530 _aIssued also in print.
538 _aMode of access: Internet via World Wide Web.
546 _aIn English.
588 0 _aDescription based on online resource; title from PDF title page (publisher's Web site, viewed 02. Mai 2023)
650 4 _aAngewandte Mathematik.
_964805
650 4 _aFraktionale Infinitesimalrechnung.
_977413
650 4 _aQualitätskontrolle.
_977414
650 4 _aSteuerungstechnik.
_976432
650 7 _aTechnology & Engineering / Automation.
_2bisacsh
_975266
700 1 _aChambers, Jonathon,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977415
700 1 _aChen, YangQuan,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977416
700 1 _aChen, YangQuan,
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
_977416
700 1 _aDomański, Paweł D.,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977417
700 1 _aDomański, Paweł D.,
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
_977417
700 1 _aDomek, Stefan,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977418
700 1 _aDuncan, Tyrone E.,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977419
700 1 _aFalkowski, Michał,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977420
700 1 _aGuc, Furkan,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977421
700 1 _aHollenbeck, Derek,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977422
700 1 _aHuang, Yulong,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977423
700 1 _aLiu, Kai,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977424
700 1 _aMinati, Ludovico,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977425
700 1 _aOkoński, Michał W.,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977426
700 1 _aOświęcimka, Paweł,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977427
700 1 _aPasik-Duncan, Bozenna,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977428
700 1 _aRocki, Dariusz,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977429
700 1 _aRodriguez, Carlos,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977430
700 1 _aShi, Peng,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977431
700 1 _aViola, Jairo,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977432
700 1 _aZhang, Yonggang,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977433
700 1 _aZhao, Yuxin,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977434
700 1 _aZhu, Fengchi,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977435
700 1 _aŁawryńczuk, Maciej,
_econtributor.
_4ctb
_4https://id.loc.gov/vocabulary/relators/ctb
_977436
700 1 _aŁawryńczuk, Maciej,
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
_977436
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tDG Plus DeG Package 2022 Part 1
_z9783110766820
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE COMPLETE 2022 English
_z9783110993899
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE COMPLETE 2022
_z9783110994810
_oZDB-23-DGG
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE Engineering, Computer Sciences 2022 English
_z9783110994223
773 0 8 _iTitle is part of eBook package:
_dDe Gruyter
_tEBOOK PACKAGE Engineering, Computer Sciences 2022
_z9783110994193
_oZDB-23-DEI
776 0 _cEPUB
_z9783110729139
776 0 _cprint
_z9783110729078
856 4 0 _uhttps://doi.org/10.1515/9783110729122
856 4 0 _uhttps://www.degruyter.com/isbn/9783110729122
856 4 2 _3Cover
_uhttps://www.degruyter.com/document/cover/isbn/9783110729122/original
912 _a978-3-11-076682-0 DG Plus DeG Package 2022 Part 1
_b2022
912 _a978-3-11-099389-9 EBOOK PACKAGE COMPLETE 2022 English
_b2022
912 _a978-3-11-099422-3 EBOOK PACKAGE Engineering, Computer Sciences 2022 English
_b2022
912 _aEBA_CL_CHCOMSGSEN
912 _aEBA_CL_MTPY
912 _aEBA_DGALL
912 _aEBA_EBKALL
912 _aEBA_ECL_CHCOMSGSEN
912 _aEBA_ECL_MTPY
912 _aEBA_EEBKALL
912 _aEBA_ESTMALL
912 _aEBA_STMALL
912 _aGBV-deGruyter-alles
912 _aPDA12STME
912 _aPDA13ENGE
912 _aPDA18STMEE
912 _aPDA5EBK
912 _aZDB-23-DEI
_b2022
912 _aZDB-23-DGG
_b2022
942 _cEBK
999 _c84516
_d84516