000 02430nmm a2200373 a 4500
001 00011179
003 WSP
005 20240731095230.0
007 cr |uu|||uu|||
008 190306s2019 si a ob 001 0 eng d
040 _aWSPC
_beng
_cWSPC
020 _a9789813277137
_q(ebook)
020 _z9789813277090
_q(hbk.)
020 _z9813277092
_q(hbk.)
050 0 4 _aTK7871.85
_b.A37 2019
082 0 4 _a621.38152
_223
100 1 _aAhrenkiel, Richard K.
_9178596
245 1 0 _aTheory and methods of photovoltaic material characterization
_h[electronic resource] /
_cRichard K. Ahrenkiel, S. Phil Ahrenkiel.
260 _aSingapore :
_bWorld Scientific Publishing Co. Pte Ltd.,
_c©2019.
300 _a1 online resource (324 p.) :
_bill.
490 0 _aMaterials and energy ;
_vv. 13
538 _aMode of access: World Wide Web.
538 _aSystem requirements: Adobe Acrobat Reader.
588 _aTitle from web page (viewed March 6, 2019).
504 _aIncludes bibliographical references and index.
505 0 _aSemiconductor fundamentals -- Optical absorption and radiation -- Recombination -- Carrier diffusion and confinement -- Planar device analysis -- Transient photoconductivity -- Time resolved photoluminescence -- Auger recombination -- Trapping spectroscopy -- Steady state techniques -- Free carrier absorption -- Charge separation effects -- Self absorption and photon recycling -- Dual sensor techniques.
520 _a"This book provides an extensive review of the theory of transport and recombination properties in semiconductors. The emphasis is placed on electrical and optical techniques. There is a presentation of the latest experimental and theoretical techniques used to analyze minority-carrier lifetime. The relevant hardware and instrumentation are described. The newest techniques of lifetime mapping are presented. The issues are discussed relating to effects that mask carrier lifetime in certain device structures. The discrepancy between photoconductive and photoluminescence measurement results are analyzed."--
_cPublisher's website.
650 0 _aSemiconductors
_xTransportation.
_9178597
650 0 _aSemiconductors
_xRecombination.
_9178598
655 0 _aElectronic books.
_93294
700 1 _aAhrenkiel, S. Phil.
_9178599
856 4 0 _uhttps://www.worldscientific.com/worldscibooks/10.1142/11179#t=toc
_zAccess to full text is restricted to subscribers.
942 _cEBK
999 _c97838
_d97838